Beryllium (Be)
alkaline-earth-metalSolid
ਮਿਆਰੀ ਪਰਮਾਣੂ ਭਾਰ
9.012183 uਇਲੈਕਟ੍ਰਾਨ ਵਿਨਿਆਸ
[He] 2s2ਪਿਘਲਣ ਦਰਜਾ
1286.85 °Cਉਬਾਲ ਦਰਜਾ
2470.85 °Cਘਣਤਾ
1850 kg/m³ਆਕਸੀਕਰਨ ਅਵਸਥਾਵਾਂ
0, +1, +2ਬਿਜਲਈ ਰਿਣਾਤਮਕਤਾ (ਪਾਲਿੰਗ)
1.57ਆਇਨੀਕਰਨ ਊਰਜਾ (ਪਹਿਲੀ)
9.322699 eVਖੋਜ ਦਾ ਸਾਲ
1797ਪਰਮਾਣੂ ਅਰਧ-ਵਿਆਸ
105 pmਵੇਰਵੇ
Beryllium is a light alkaline earth metal with unusually high stiffness, low density, and a high melting point for its mass. Its chemistry is dominated by the +2 oxidation state, but the small Be²⁺ ion gives many compounds pronounced covalent character. The element is rare in accessible ores, chiefly obtained from beryl and bertrandite, and is technologically important where low mass, dimensional stability, and transparency to X-rays are valuable.
The metal, steel gray in color, has many desirable properties. As one of the lightest of all metals, it has one of the highest melting points of the light metals. Its modulus of elasticity is about one third greater than that of steel. It resists attack by concentrated nitric acid, has excellent thermal conductivity, and is nonmagnetic. It has a high permeability to X-rays and when bombarded by alpha particles, as from radium or polonium, neutrons are produced in the amount of about 30 neutrons/million alpha particles.
At ordinary temperatures, beryllium resists oxidation in air, although its ability to scratch glass is probably due to the formation of a thin layer of the oxide.
The name derives from the Greek word beryllos for "beryl", a gemstone in which it is found (3BeO×Al2O3×6SiO2).
Beryllium was discovered by the French chemist and pharmacist Nicholas-Louis Vauquelin in beryl and emerald in 1797. The element was first separated in 1828 by the French chemist Antoine-Alexandre-Brutus Bussy and independently by the German chemist Friedrich Wöhler. Because the salts of beryllium have a sweet taste, the element was also known as glucinium from the Greek glykys for "sweet", until IUPAC selected the name beryllium in 1949.
Although emeralds and beryl were known to ancient civilizations, they were first recognized as the same mineral (Be3Al2(SiO3)6) by Abbé Haüy in 1798. Later that year, Louis-Nicholas Vauquelin, a French chemist, discovered that an unknown element was present in emeralds and beryl. Attempts to isolate the new element finally succeeded in 1828 when two chemists, Friedrich Wölhler of Germany and A. Bussy of France, independently produced beryllium by reducing beryllium chloride (BeCl2) with potassium in a platinum crucible. Today, beryllium is primarily obtained from the minerals beryl (Be3Al2(SiO3)6) and bertrandite (4BeO·2SiO2·H2O) through a chemical process or through the electrolysis of a mixture of molten beryllium chloride (BeCl2) and sodium chloride (NaCl).
From the Greek word beryllos, beryl; also called glucinium or glucinum, Greek glykys, sweet. Discovered in the oxide form by Vauquelin in both beryl and emeralds in 1798. The metal was isolated in 1828 by Wohler and by Bussy independently by the action of potassium on beryllium chloride.
Pure beryllium is a hard, brittle, steel-gray metal with a metallic luster. It is solid at ordinary conditions and forms a thin, adherent oxide film that helps resist further oxidation in dry air. Powdered or freshly machined material is more reactive and presents greater handling risk.
Beryllium metal is used in specialized aerospace, defense, satellite, and scientific instruments where stiffness, low density, and thermal stability justify its cost and handling controls. Thin beryllium windows transmit X-rays and are used in X-ray tubes and detectors. Copper-beryllium alloys are important for springs, electrical contacts, non-sparking tools, and fatigue-resistant precision parts. Beryllium oxide ceramics are used as electrically insulating but thermally conductive materials in some electronic and microwave components.
Beryllium is relatively transparent to X-rays and is used to make windows for X-ray tubes. When exposed to alpha particles, such as those emitted by radium or polonium, beryllium emits neutrons and is used as a neutron source. Beryllium is also used as a moderator in nuclear reactors.
Beryllium is alloyed with copper (2% beryllium, 98% copper) to form a wear resistant material, known as beryllium bronze, used in gyroscopes and other devices where wear resistance is important. Beryllium is alloyed with nickel (2% beryllium, 98% nickel) to make springs, spot-welding electrodes and non-sparking tools. Other beryllium alloys are used in the windshield, brake disks and other structural components of the space shuttle.
Beryllium oxide (BeO), a compound of beryllium, is used in the nuclear industry and in ceramics.
Beryllium was once known as glucinum, which means sweet, since beryllium and many of its compounds have a sugary taste. Unfortunately for the chemists that discovered this particular property, beryllium and many of its compounds are poisonous and should never be tasted or ingested.
Beryllium is used as an alloying agent in producing beryllium copper, which is extensively used for springs, electrical contacts, spot-welding electrodes, and non-sparking tools. It is applied as a structural material for high-speed aircraft, missiles, spacecraft, and communication satellites. Other uses include windshield frame, brake discs, support beams, and other structural components of the space shuttle.
Because beryllium is relatively transparent to X-rays, ultra-thin Be-foil is finding use in X-ray lithography for reproduction of micro-miniature integrated circuits.
Beryllium is used in nuclear reactors as a reflector or moderator for it has a low thermal neutron absorption cross section.
It is used in gyroscopes, computer parts, and instruments where lightness, stiffness, and dimensional stability are required. The oxide has a very high melting point and is also used in nuclear work and ceramic applications.
Isotopes in Geochronology
Cosmogenic 10Be and 7Be isotopes are produced in the atmosphere, largely by cosmic-ray spallation of nitrogen and oxygen. Because of its relatively short half-life (7Be, half-life t1/2=53 d, compared to that of 10Be, half-life t1/2=1.39×106 a, where the unit symbol “d” stands for day and “a” stands for year), measurements of cosmogenic 7Be, and especially the isotope-amount ratio n(7Be)/n(10Be), have been used to study rates of atmospheric circulation, mixing, formation of aerosols (fine solids or liquids suspended in a gas; e.g. smoke and mist are aerosols), and particle deposition [44] C. E. Jordan, J. E. Dibb, R. C. Finkel. J. Geophys. Res. Atmos.108, (2003).. Cosmogenic atmospheric beryllium isotopes (7Be and 10Be) are deposited on the Earth’s surface, where they accumulate in soils, sediments, and snow while decaying away. Measurements of cosmogenic beryllium isotopes in such deposits are used to explore rates of soil formation, erosion, sedimentation, and snow accumulation on time scales ranging from months (7Be) to millions of years (10Be) [45] J. M. Kaste, S. A. Norton, C. T. Hess. Rev. Mineral. Geochem.50, 271 (2002)., [46] J. A. Graly, P. R. Bierman, L. J. Reusser, M. J. Pavich. Geochim. Cosmochim. Acta.74, 6814 (2010).. The minerals in rocks at the Earth’s surface interact with cosmic rays and form substantial quantities of 10Be and 7Be, thus providing a tool to determine the ages of geologic processes. In some situations, it is possible to estimate “exposure ages” for rocks in eroding terrains [47] P. R. Bierman, M. W. Caffee, P. T. Davis, K. Marsella, M. Pavich, P. Colgan, D. Mickelson, J. Larsen. Rev. Mineral. Geochem.50, 147 (2002)., [48] P. Bierman, E. A. Zen, M. Pavich, L. Reusser. U.S. Geol. Surv. Circ.1264, 191 (2004)., [49] L. Reusser, P. Bierman, M. Pavich, J. Larsen, R. Finkel. Am. J. Sci.306, 69 (2006).. By comparing measured 10Be concentrations with estimated rates of in situ cosmogenic 10Be production, the rate of rock erosion and formation of canyons and other geologic features can be determined (Fig. IUPAC.4.1).
Anthropogenic 10Be was produced by nuclear bomb explosions largely through the reaction of fast neutrons (neutrons produced by nuclear fission having high kinetic energy) with 13C via the 13C (n, alpha) 10Be reaction in atmospheric CO2. Although the quantity of 10Be produced in this way is small, its presence above natural background concentrations in some environmental samples can potentially provide information about bomb-related processes and contamination [50] N. E. Whitehead, S. Endo, K. Tanaka, T. Takatsuji, M. Hoshi, S. Fukutani, R. G. Ditchburn, A. Zondervan. J. Environ. Radioact.99, 260 (2008)..
Beryllium most commonly forms Be²⁺ compounds, although their bonding is often strongly polarizing and partly covalent. Beryllium oxide (BeO) is a refractory ceramic with high thermal conductivity and electrical insulation. Beryllium hydroxide (Be(OH)₂) is amphoteric, dissolving in both acids and strong bases. Beryllium chloride (BeCl₂) is polymeric in the solid state and hydrolyzes readily. Natural beryllium occurs mainly in silicate minerals, especially beryl, with ideal formula Be₃Al₂Si₆O₁₈, and in bertrandite, Be₄Si₂O₇(OH)₂.
See more information at the Beryllium compound page.
Beryllium metal, dusts, fumes, and soluble compounds are highly toxic by inhalation. Occupational exposure can cause sensitization and chronic beryllium disease, a serious immune-mediated lung disorder. Machining, grinding, and high-temperature processing require strict dust and fume control. Solid finished articles are less hazardous if they are not abraded, heated, or otherwise made into respirable material.
Beryllium and its salts are toxic and should be handled with the greatest of care. Beryllium and its compounds should not be tasted to verify the sweetish nature of beryllium (as did early experimenters). The metal, its alloys, and its salts can be handled if certain work codes are observed, but no attempt should be made to work with beryllium before becoming familiar with proper safeguards.
Beryllium is a minor constituent of the continental crust and is concentrated by geological processes into uncommon silicate minerals. It has no known essential biological role. In soils and waters its mobility depends strongly on pH, mineral surfaces, and complexation; it is generally not abundant in natural waters. Environmental releases are mainly associated with mining, ore processing, combustion of some coals, and industrial handling of beryllium-containing materials.
Commercial beryllium supply is limited by the scarcity of workable deposits and by the need for controlled processing because of toxicity. Bertrandite ores in the United States and beryl from several regions have been important feedstocks. Extraction is chemically complex, and much demand is for high-value metal, copper-beryllium master alloys, and beryllium oxide ceramics rather than bulk structural metal. Recycling occurs from manufacturing scrap and selected end-of-life alloys, but health controls and material traceability are significant constraints. Substitution is often possible only with loss of stiffness, conductivity, X-ray transparency, or fatigue performance.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
Beryllium is cosmically scarce because stable nuclei with mass numbers 5 and 8 are absent, limiting its production in ordinary stellar fusion chains. Most natural beryllium is thought to form by cosmic-ray spallation of heavier nuclei such as carbon, nitrogen, and oxygen in interstellar material. It is present in the Solar System only at low abundance compared with neighboring light elements.
- Beryllium has only one stable isotope, ⁹Be.
- Emerald and aquamarine are gem varieties of beryl colored by trace impurities, not by beryllium itself.
- Beryllium windows can pass X-rays while blocking visible light and air.
- Copper-beryllium tools are valued where sparking must be minimized.
- Beryllium oxide combines ceramic insulation with unusually high heat conduction.
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- -0.52 eV (ਨਕਾਰਾਤਮਕ ਮੁੱਲ — ਪਰਮਾਣੂ ਵੱਲੋਂ ਵਾਧੂ ਇਲੈਕਟਰੌਨ ਜੋੜਨ ਦੀ ਭਵਿੱਖਬਾਣੀ ਨਹੀਂ)
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- [He] 2s2
ਤਾਪਗਤੀਕੀ
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- 4932 °C
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- 3.358035 eV
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- 3.358035 eV
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- 3.358035 eV
ਨਾਭਿਕੀ
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- ਸਭ ਤੋਂ ਸਥਿਰ ਸਮਸਥਾਨਿਕ
- Be-9
- ਖੋਜ ਦਾ ਸਾਲ
- 1797
ਪ੍ਰਚੁਰਤਾ
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- 2.8 mg/kg ਸਾਰੇ ਤੱਤਾਂ ਦੀ ਪ੍ਰਚੁਰਤਾ (ਧਰਤੀ ਦੀ ਛਾਲ) ਦੀ ਤੁਲਨਾ ਕਰੋ →
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ਕ੍ਰਿਸਟਲ ਬਣਤਰ
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- 229 pm
ਇਲੈਕਟ੍ਰਾਨਿਕ ਬਣਤਰ
- ਪ੍ਰਤੀ ਖੋਲ ਇਲੈਕਟ੍ਰਾਨ
- 2, 2 ਸਾਰੇ ਤੱਤਾਂ ਦੀ ਪ੍ਰਤੀ ਖੋਲ ਇਲੈਕਟ੍ਰਾਨ ਦੀ ਤੁਲਨਾ ਕਰੋ →
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- ਟਰਮ ਪ੍ਰਤੀਕ
- 1S0
- InChI
- InChI=1S/Be
- InChI ਕੁੰਜੀ
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N
ਇਲੈਕਟ੍ਰਾਨ ਵਿਨਿਆਸ ਮਾਪਿਆ
Be: 2s²[He] 2s²1s² 2s²ਪਰਮਾਣੂ ਮਾਡਲ
ਸਮਸਥਾਨਿਕ ਨਿਊਟ੍ਰਾਨਾਂ ਦੀ ਗਿਣਤੀ, ਪੁੰਜ ਅਤੇ ਸਥਿਰਤਾ ਬਦਲਦੇ ਹਨ — ਉਦਾਸੀਨ ਪਰਮਾਣੂ ਦਾ ਇਲੈਕਟ੍ਰਾਨ ਵਿਨਿਆਸ ਨਹੀਂ।
ਸੰਕੇਤਕ ਪਰਮਾਣੂ ਮਾਡਲ, ਪੈਮਾਨੇ ਅਨੁਸਾਰ ਨਹੀਂ।
ਪਰਮਾਣੂ ਪਛਾਣ-ਚਿੰਨ੍ਹ
ਨਿਕਾਸ / ਅਵਸ਼ੋਸ਼ਣ ਸਪੈਕਟ੍ਰਮ
ਸਮਸਥਾਨਿਕ ਵੰਡ
| ਪੁੰਜ ਸੰਖਿਆ | ਪਰਮਾਣੂ ਪੁੰਜ (u) | ਕੁਦਰਤੀ ਪ੍ਰਚੁਰਤਾ | ਅਰਧ-ਆਯੂ |
|---|---|---|---|
| 9 ਸਥਿਰ | 9.012183065 ± 0.000000082 | 100.0000% | ਸਥਿਰ |
ਫੇਜ਼ / ਅਵਸਥਾ
ਕਾਰਨ: ਪਿਘਲਣ ਦਰਜੇ (1286.85 °C) ਤੋਂ 1261.8 °C ਘੱਟ
ਸੰਕੇਤਕ, ਪੈਮਾਨੇ ਅਨੁਸਾਰ ਨਹੀਂ
ਅਵਸਥਾ ਪਰਿਵਰਤਨ ਬਿੰਦੂ
ਸੰਕ੍ਰਮਣ ਊਰਜਾਵਾਂ
ਪਿਘਲਣ ਦਰਜੇ 'ਤੇ 1 mol ਨੂੰ ਪਿਘਲਾਉਣ ਲਈ ਲੋੜੀਂਦੀ ਊਰਜਾ
ਉਬਾਲ ਦਰਜੇ 'ਤੇ 1 mol ਦੇ ਵਾਸ਼ਪੀਕਰਨ ਲਈ ਲੋੜੀਂਦੀ ਊਰਜਾ
ਉਰਧਪਾਤਨ ਦਰਜੇ 'ਤੇ 1 mol ਦੇ ਉਰਧਪਾਤਨ ਲਈ ਲੋੜੀਂਦੀ ਊਰਜਾ
ਘਣਤਾ
ਮਿਆਰੀ ਹਾਲਤਾਂ 'ਤੇ
ਮਿਆਰੀ ਹਾਲਤਾਂ 'ਤੇ
ਉੱਨਤ
ਪਰਮਾਣੂ ਸਪੈਕਟ੍ਰਮ
ਉਪਲਬਧ ਸਪੈਕਟ੍ਰਮੀ ਰੇਖਾਵਾਂ ?
| ਆਇਨ | ਆਵੇਸ਼ | ਕੁੱਲ ਰੇਖਾਵਾਂ | ਸੰਕ੍ਰਮਣ ਸੰਭਾਵਨਾਵਾਂ | ਪੱਧਰਾਂ ਦੇ ਨਾਮਾਂਕਨ |
|---|---|---|---|---|
| Be I | 0 | 581 | 394 | 581 |
| Be II | +1 | 681 | 149 | 681 |
| Be III | +2 | 323 | 302 | 316 |
| Be IV | +3 | 142 | 142 | 142 |
ਆਇਨਿਕ ਅਰਧ-ਵਿਆਸ
| ਆਵੇਸ਼ | ਉਪਸਹਿ-ਸੰਯੋਜਨ | ਸਪਿਨ | ਅਰਧ-ਵਿਆਸ |
|---|---|---|---|
| +2 | 3 | ਉਪਲਬਧ ਨਹੀਂ | 16 pm |
| +2 | 4 | ਉਪਲਬਧ ਨਹੀਂ | 27 pm |
| +2 | 6 | ਉਪਲਬਧ ਨਹੀਂ | 45 pm |
ਯੋਗਿਕ
ਸਮਸਥਾਨਿਕ (1)
| ਪੁੰਜ ਸੰਖਿਆ | ਪਰਮਾਣੂ ਪੁੰਜ (u) | ਕੁਦਰਤੀ ਪ੍ਰਚੁਰਤਾ | ਅਰਧ-ਆਯੂ | ਖ਼ੈ ਦੀ ਵਿਧੀ | |
|---|---|---|---|---|---|
| 9 ਸਥਿਰ | 9.012183065 ± 0.000000082 | 100.0000% | ਸਥਿਰ | stable |
ਸਪੈਕਟ੍ਰਮੀ ਰੇਖਾਵਾਂ
| ਤਰੰਗ-ਲੰਬਾਈ (nm) | ਤੀਬਰਤਾ | ਆਇਨੀਕਰਨ ਪੜਾਅ | ਕਿਸਮ | ਸੰਕ੍ਰਮਣ | ਸ਼ੁੱਧਤਾ | ਸਰੋਤ | |
|---|---|---|---|---|---|---|---|
| 381.3453 nm | 22 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4d 1D | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 385.17 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 386.513 nm | 3 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 386.5427 nm | 5 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 386.5517 nm | 1 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 386.5725 nm | 2 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 386.6022 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 386.6037 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 388.143 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4s 3S → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 388.143 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4s 3S → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 388.143 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4s 3S → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 399.55 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | ਮਾਪਿਆ | NIST | |
| 399.55 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | ਮਾਪਿਆ | NIST | |
| 399.55 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 403.93 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 416.63 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4s 1S → 1s.5p 1P* | ਮਾਪਿਆ | NIST | |
| 419.97 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4s 1S → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 424.41 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 424.41 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 424.906 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 425.2 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | ਮਾਪਿਆ | NIST | |
| 425.2 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | ਮਾਪਿਆ | NIST | |
| 425.2 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | ਮਾਪਿਆ | NIST | |
| 425.2987 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 425.2987 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 425.2987 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 425.3707 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 425.3707 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 425.4085 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 432.953 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | ਮਾਪਿਆ | NIST | |
| 433.302 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | ਮਾਪਿਆ | NIST | |
| 433.306 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | ਮਾਪਿਆ | NIST | |
| 433.306 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | ਮਾਪਿਆ | NIST | |
| 436.0665 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | ਮਾਪਿਆ | NIST | |
| 436.0986 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | ਮਾਪਿਆ | NIST | |
| 436.1032 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 437.112 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | ਮਾਪਿਆ | NIST | |
| 440.393 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | ਮਾਪਿਆ | NIST | |
| 440.408 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | ਮਾਪਿਆ | NIST | |
| 440.408 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | ਮਾਪਿਆ | NIST | |
| 440.7936 nm | 19 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4s 1S | ਮਾਪਿਆ | NIST | |
| 445.828 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5p 1P* | ਮਾਪਿਆ | NIST | |
| 446.786 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | ਮਾਪਿਆ | NIST | |
| 446.802 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | ਮਾਪਿਆ | NIST | |
| 447.669 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | ਮਾਪਿਆ | NIST | |
| 447.672 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 1F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 1F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 448.651 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 449.54 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5f 1F* | ਮਾਪਿਆ | NIST | |
| 449.54 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 449.54 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 449.96 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 1F* → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 449.96 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 1F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 1F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 450.511 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4f 3F* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 452.6406 nm | 7 | Be I | emission | 1s2.2s.4p 1P* → 1s2.2p.3p 1P | ਮਾਪਿਆ | NIST | |
| 453.543 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | ਮਾਪਿਆ | NIST | |
| 453.548 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | ਮਾਪਿਆ | NIST | |
| 453.548 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | ਮਾਪਿਆ | NIST | |
| 453.58 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 1P* → 1s.5p 1P* | ਮਾਪਿਆ | NIST | |
| 454.06 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | ਮਾਪਿਆ | NIST | |
| 454.062 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | ਮਾਪਿਆ | NIST | |
| 454.062 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | ਮਾਪਿਆ | NIST | |
| 454.788 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | ਮਾਪਿਆ | NIST | |
| 454.789 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | ਮਾਪਿਆ | NIST | |
| 454.793 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | ਮਾਪਿਆ | NIST | |
| 454.8055 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | ਮਾਪਿਆ | NIST | |
| 454.85379 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | ਮਾਪਿਆ | NIST | |
| 457.266603 nm | 30 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.3d 1D | ਮਾਪਿਆ | NIST | |
| 457.55 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 1P* → 1s.5d 1D | ਮਾਪਿਆ | NIST | |
| 458.12 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 1P* → 1s.5d 3D | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 459.61 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 461.05 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 462.827 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 3D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 463.774 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 463.774 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4d 1D → 1s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 465.722198 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5p 2P* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.730484 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5s 2S → 6p 2P* | ਮਾਪਿਆ | NIST | |
| 465.792545 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5p 2P* → 6s 2S | ਮਾਪਿਆ | NIST | |
| 465.805836 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5s 2S → 6p 2P* | ਮਾਪਿਆ | NIST | |
| 465.827127 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.827302 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5p 2P* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.85207 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6p 2P* | ਮਾਪਿਆ | NIST | |
| 465.852419 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5p 2P* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.857919 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6g 2G | ਮਾਪਿਆ | NIST | |
| 465.857973 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.870408 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.870532 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.872059 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6h 2H* | ਮਾਪਿਆ | NIST | |
| 465.872085 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6g 2G | ਮਾਪਿਆ | NIST | |
| 465.879556 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.879621 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6g 2G | ਮਾਪਿਆ | NIST | |
| 465.8800567 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6h 2H* | ਮਾਪਿਆ | NIST | |
| 465.8850804 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6h 2H* | ਮਾਪਿਆ | NIST | |
| 465.892111 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.892116 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.892578 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5g 2G → 6f 2F* | ਮਾਪਿਆ | NIST | |
| 465.89548 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6p 2P* | ਮਾਪਿਆ | NIST | |
| 465.89553 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5f 2F* → 6d 2D | ਮਾਪਿਆ | NIST | |
| 465.9228055 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5p 2P* → 6s 2S | ਮਾਪਿਆ | NIST | |
| 465.927462 nm | ਉਪਲਬਧ ਨਹੀਂ | Be IV | emission | 5d 2D → 6p 2P* | ਮਾਪਿਆ | NIST | |
| 466.346 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5s 3S | ਮਾਪਿਆ | NIST | |
| 466.346 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5s 3S | ਮਾਪਿਆ | NIST | |
| 466.346 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.4p 3P* → 1s.5s 3S | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 466.37 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | ਮਾਪਿਆ | NIST | |
| 467.3332 nm | 1060 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | ਮਾਪਿਆ | NIST | |
| 467.342 nm | 1160 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | ਮਾਪਿਆ | NIST | |
| 467.345 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | ਮਾਪਿਆ | NIST | |
| 470.234 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | ਮਾਪਿਆ | NIST | |
| 470.252 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | ਮਾਪਿਆ | NIST | |
| 470.252 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | ਮਾਪਿਆ | NIST | |
| 470.9391 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | ਮਾਪਿਆ | NIST | |
| 470.9394 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | ਮਾਪਿਆ | NIST | |
| 470.9396 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | ਮਾਪਿਆ | NIST | |
| 480.759 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | ਮਾਪਿਆ | NIST | |
| 480.777 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | ਮਾਪਿਆ | NIST | |
| 482.799 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | ਮਾਪਿਆ | NIST | |
| 482.812 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | ਮਾਪਿਆ | NIST | |
| 482.818 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | ਮਾਪਿਆ | NIST | |
| 484.9153 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | ਮਾਪਿਆ | NIST | |
| 484.9153 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | ਮਾਪਿਆ | NIST | |
| 484.9156 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | ਮਾਪਿਆ | NIST | |
| 485.233 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | ਮਾਪਿਆ | NIST | |
| 485.238 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | ਮਾਪਿਆ | NIST | |
| 485.238 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | ਮਾਪਿਆ | NIST | |
| 485.6045 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 485.61897 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 485.61897 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 485.6741 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 485.6741 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 485.82 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | ਮਾਪਿਆ | NIST | |
| 485.823 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | ਮਾਪਿਆ | NIST | |
| 485.823 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | ਮਾਪਿਆ | NIST | |
| 508.7714 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | ਮਾਪਿਆ | NIST | |
| 508.7714 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | ਮਾਪਿਆ | NIST | |
| 508.7719 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | ਮਾਪਿਆ | NIST | |
| 515.2 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 1D → 1s.7p 1P* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 515.778 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 3D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 516.51 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 1D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 516.51 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.5d 1D → 1s.7f 3F* | ਮਾਪਿਆ | NIST | |
| 521.8119 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | ਮਾਪਿਆ | NIST | |
| 521.834 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | ਮਾਪਿਆ | NIST | |
| 521.834 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | ਮਾਪਿਆ | NIST | |
| 525.007 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.9p 1P* | ਮਾਪਿਆ | NIST | |
| 525.584 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | ਮਾਪਿਆ | NIST | |
| 525.59 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | ਮਾਪਿਆ | NIST | |
| 526.1527 nm | 5 | Be I | emission | 1s2.2s.5p 1P* → 1s2.2p.3p 1P | ਮਾਪਿਆ | NIST | |
| 527.027 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | ਮਾਪਿਆ | NIST | |
| 527.0806 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | ਮਾਪਿਆ | NIST | |
| 536.552 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.8p 1P* | ਮਾਪਿਆ | NIST | |
| 540.299 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | ਮਾਪਿਆ | NIST | |
| 540.306 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | ਮਾਪਿਆ | NIST | |
| 540.306 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | ਮਾਪਿਆ | NIST | |
| 541.018 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | ਮਾਪਿਆ | NIST | |
| 541.022 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | ਮਾਪਿਆ | NIST | |
| 541.022 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | ਮਾਪਿਆ | NIST | |
| 541.612 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | ਮਾਪਿਆ | NIST | |
| 541.636 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | ਮਾਪਿਆ | NIST | |
| 544.069 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | ਮਾਪਿਆ | NIST | |
| 544.073 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | ਮਾਪਿਆ | NIST | |
| 544.076 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | ਮਾਪਿਆ | NIST | |
| 554.648 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.7p 1P* | ਮਾਪਿਆ | NIST | |
| 555.881 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 555.881 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 555.881 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | ਮਾਪਿਆ | NIST | |
| 585.7012 nm | 3 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.6p 1P* | ਮਾਪਿਆ | NIST | |
| 593.771 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.9p 1P* | ਮਾਪਿਆ | NIST | |
| 608.58 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 1P* | ਮਾਪਿਆ | NIST | |
| 608.6 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 3P* | ਮਾਪਿਆ | NIST | |
| 614.2 nm | ਉਪਲਬਧ ਨਹੀਂ | Be III | emission | 1s.2s 1S → 1s.2p 1P* | ਮਾਪਿਆ | NIST | |
| 622.9108 nm | 3 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7f 1F* | ਮਾਪਿਆ | NIST | |
| 627.9418 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | ਮਾਪਿਆ | NIST | |
| 627.9737 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | ਮਾਪਿਆ | NIST | |
| 627.9737 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | ਮਾਪਿਆ | NIST | |
| 631.966 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 1P* | ਮਾਪਿਆ | NIST | |
| 632.145 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 3P* | ਮਾਪਿਆ | NIST | |
| 647.3536 nm | 7 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.5p 1P* | ਮਾਪਿਆ | NIST | |
| 654.784 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | ਮਾਪਿਆ | NIST | |
| 654.793 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | ਮਾਪਿਆ | NIST | |
| 654.794 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | ਮਾਪਿਆ | NIST | |
| 655.833 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | ਮਾਪਿਆ | NIST | |
| 655.839 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | ਮਾਪਿਆ | NIST | |
| 655.839 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | ਮਾਪਿਆ | NIST | |
| 656.4519 nm | 9 | Be I | emission | 1s2.2p2 1D → 1s2.2s.6f 1F* | ਮਾਪਿਆ | NIST | |
| 663.633 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | ਮਾਪਿਆ | NIST | |
| 663.644 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | ਮਾਪਿਆ | NIST | |
| 663.644 nm | ਉਪਲਬਧ ਨਹੀਂ | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | ਮਾਪਿਆ | NIST | |
| 671.15 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 671.21 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 671.23 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 671.25 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 671.25 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 671.26 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | ਮਾਪਿਆ | NIST | |
| 672.598 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.6p 1P* | ਮਾਪਿਆ | NIST | |
| 675.675 nm | 10 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | ਮਾਪਿਆ | NIST | |
| 675.712 nm | 110 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | ਮਾਪਿਆ | NIST | |
| 678.656 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | ਮਾਪਿਆ | NIST | |
| 678.656 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | ਮਾਪਿਆ | NIST | |
| 678.656 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | ਮਾਪਿਆ | NIST | |
| 688.422 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 688.422 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 688.423 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 688.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 688.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 688.444 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | ਮਾਪਿਆ | NIST | |
| 698.273 nm | 13 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2p2 1D | ਮਾਪਿਆ | NIST | |
| 704.98 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | ਮਾਪਿਆ | NIST | |
| 704.98 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | ਮਾਪਿਆ | NIST | |
| 705 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | ਮਾਪਿਆ | NIST | |
| 715.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 715.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 715.441 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 715.459 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 715.46 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 715.465 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | ਮਾਪਿਆ | NIST | |
| 720.9132 nm | 13 | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 1F* | ਮਾਪਿਆ | NIST | |
| 720.928 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 3F* | ਮਾਪਿਆ | NIST | |
| 730.819 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9d 1D | ਮਾਪਿਆ | NIST | |
| 740.1196 nm | 210 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | ਮਾਪਿਆ | NIST | |
| 740.1431 nm | 110 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | ਮਾਪਿਆ | NIST | |
| 743.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | ਮਾਪਿਆ | NIST | |
| 743.44 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | ਮਾਪਿਆ | NIST | |
| 743.46 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | ਮਾਪਿਆ | NIST | |
| 744.887 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9s 1S | ਮਾਪਿਆ | NIST | |
| 749.842 nm | ਉਪਲਬਧ ਨਹੀਂ | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.8d 1D | ਮਾਪਿਆ | NIST |
ਵਿਸਤ੍ਰਿਤ ਗੁਣ
ਸਹਿ-ਸੰਯੋਜਕ ਅਰਧ-ਵਿਆਸ (ਵਿਸਤ੍ਰਿਤ)
- ਸਹਿ-ਸੰਯੋਜਕ ਅਰਧ-ਵਿਆਸ (ਪਿਊਕੋ)
- 102 pm
- ਸਹਿ-ਸੰਯੋਜਕ ਅਰਧ-ਵਿਆਸ (ਪਿਊਕੋ, ਦੋਹਰਾ ਬੰਧਨ)
- 90 pm
- ਸਹਿ-ਸੰਯੋਜਕ ਅਰਧ-ਵਿਆਸ (ਪਿਊਕੋ, ਤਿਹਰਾ ਬੰਧਨ)
- 85 pm
- ਸਹਿ-ਸੰਯੋਜਕ ਅਰਧ-ਵਿਆਸ (ਬ੍ਰੈਗ)
- 115 pm
ਵਾਨ ਡਰ ਵਾਲਜ਼ ਅਰਧ-ਵਿਆਸ
- Truhlar
- 153 pm
- Batsanov
- 190 pm
- Alvarez
- 198 pm
- UFF
- 274.5 pm
- MM3
- 223 pm
ਪਰਮਾਣੂ ਅਤੇ ਧਾਤਵੀ ਅਰਧ-ਵਿਆਸ
- ਪਰਮਾਣੂ ਅਰਧ-ਵਿਆਸ (ਰਾਮ)
- 219 pm
- ਧਾਤਵੀ ਅਰਧ-ਵਿਆਸ (C12)
- 112 pm
ਅੰਕਨ ਪੈਮਾਨੇ
- Mendeleev
- 75
- Pettifor
- 77
- Glawe
- 77
ਬਿਜਲਈ ਰਿਣਾਤਮਕਤਾ ਦੇ ਪੈਮਾਨੇ
- Ghosh
- 0
- Miedema
- 5
- Gunnarsson–Lundqvist
- 4
- Robles–Bartolotti
- 4
ਧਰੁਵੀਕਰਨਯੋਗਤਾ ਅਤੇ ਪ੍ਰਕੀਰਣ
- ਦੋਧਰੁਵੀ ਧਰੁਵੀਕਰਨਯੋਗਤਾ
- 37.74 a.u.
- ਦੋਧਰੁਵੀ ਧਰੁਵੀਕਰਨਯੋਗਤਾ (ਅਨਿਸ਼ਚਿਤਤਾ)
- 0.03 a.u.
- C₆
- 227 Ha·Bohr6
- C₆ (Gould–Bučko)
- 214 Ha·Bohr6
ਮੀਡੇਮਾ ਪਰਾਮੀਟਰ
- ਮੀਡੇਮਾ ਮੋਲਰ ਆਇਤਨ
- 4.9 cm3/mol
- ਮੀਡੇਮਾ ਇਲੈਕਟ੍ਰਾਨ ਘਣਤਾ
- 5
ਸਪਲਾਈ ਦਾ ਜੋਖਮ ਅਤੇ ਅਰਥਸ਼ਾਸਤਰ
- ਉਤਪਾਦਨ ਦੀ ਕੇਂਦਰਿਤਤਾ
- 85
- ਸਾਪੇਖ ਸਪਲਾਈ ਜੋਖਮ
- 8
- ਰਾਜਨੀਤਿਕ ਸਥਿਰਤਾ (ਸਭ ਤੋਂ ਵੱਡਾ ਉਤਪਾਦਕ)
- 57
ਅਵਸਥਾ ਪਰਿਵਰਤਨ ਅਤੇ ਅਪਰਰੂਪ
| ਪਿਘਲਣ ਦਰਜਾ | 1560.15 K |
| ਉਬਾਲ ਦਰਜਾ | 2741.15 K |
| ਕ੍ਰਾਂਤਿਕ ਬਿੰਦੂ (ਤਾਪਮਾਨ) | 5205.15 K |
ਆਕਸੀਕਰਨ ਅਵਸਥਾ ਦੀਆਂ ਸ਼੍ਰੇਣੀਆਂ
ਉੱਨਤ ਸੰਦਰਭ ਡਾਟਾ
ਪਰਿਰੱਖਣ ਸਥਿਰਾਂਕ (2)
| n | ਔਰਬਿਟਲ | σ |
|---|---|---|
| 1 | s | 0.3152 |
| 2 | s | 2.088 |
ਕ੍ਰਿਸਟਲ ਅਰਧ-ਵਿਆਸਾਂ ਦਾ ਵੇਰਵਾ (3)
| ਆਵੇਸ਼ | CN | ਸਪਿਨ | rcrystal (pm) | ਉਤਪੱਤੀ |
|---|---|---|---|---|
| 2 | III | 30 | ||
| 2 | IV | 41 | ||
| 2 | VI | 59 | calculated, |
ਸਮਸਥਾਨਿਕ ਖ਼ੈ ਦੀਆਂ ਵਿਧੀਆਂ (19)
| ਸਮਸਥਾਨਿਕ | ਮੋਡ | ਤੀਬਰਤਾ |
|---|---|---|
| 5 | p | — |
| 6 | 2p | 100% |
| 7 | EC | 100% |
| 8 | A | 100% |
| 10 | B- | 100% |
| 11 | B- | 100% |
| 11 | B-A | 3.3% |
| 11 | B-p | 0% |
| 11 | B-n | — |
| 12 | B- | 100% |
ਐਕਸ-ਰੇ ਖਿੰਡਾਅ ਗੁਣਾਂਕ (724)
| ਊਰਜਾ (eV) | f₁ | f₂ |
|---|---|---|
| 10 | — | 1.70333 |
| 10.1617 | — | 1.71802 |
| 10.3261 | — | 1.73284 |
| 10.4931 | — | 1.74778 |
| 10.6628 | — | 1.75737 |
| 10.8353 | — | 1.76678 |
| 11.0105 | — | 1.77624 |
| 11.1886 | — | 1.78574 |
| 11.3696 | — | 1.7953 |
| 11.5535 | — | 1.80306 |
ਵਾਧੂ ਡਾਟਾ
Estimated Crustal Abundance
The estimated element abundance in the earth's crust.
2.8 milligrams per kilogram
ਸੰਦਰਭ (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Estimated Oceanic Abundance
The estimated element abundance in the earth's oceans.
5.6×10-6 milligrams per liter
ਸੰਦਰਭ (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Sources
Sources of this element.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
ਸੰਦਰਭ (1)
- [6] Beryllium https://periodic.lanl.gov/4.shtml
ਸੰਦਰਭ
(9)
Data deposited in or computed by PubChem
The half-life and atomic mass data was provided by the Atomic Mass Data Center at the International Atomic Energy Agency.
Element data are cited from the Atomic weights of the elements (an IUPAC Technical Report). The IUPAC periodic table of elements can be found at https://iupac.org/what-we-do/periodic-table-of-elements/. Additional information can be found within IUPAC publication doi:10.1515/pac-2015-0703 Copyright © 2020 International Union of Pure and Applied Chemistry.
The information are cited from Pure Appl. Chem. 2018; 90(12): 1833-2092, https://doi.org/10.1515/pac-2015-0703.
Thomas Jefferson National Accelerator Facility (Jefferson Lab) is one of 17 national laboratories funded by the U.S. Department of Energy. The lab's primary mission is to conduct basic research of the atom's nucleus using the lab's unique particle accelerator, known as the Continuous Electron Beam Accelerator Facility (CEBAF). For more information visit https://www.jlab.org/
The periodic table at the LANL (Los Alamos National Laboratory) contains basic element information together with the history, source, properties, use, handling and more. The provenance data may be found from the link under the source name.
The periodic table contains NIST's critically-evaluated data on atomic properties of the elements. The provenance data that include data for atomic spectroscopy, X-ray and gamma ray, radiation dosimetry, nuclear physics, and condensed matter physics may be found from the link under the source name. Ref: https://www.nist.gov/pml/atomic-spectra-database
This section provides all form of data related to element Beryllium.
The element property data was retrieved from publications.