Beryllium (Be)
alkaline-earth-metalSolid
표준 원자량
9.012183 u전자 배치
[He] 2s2녹는점
1286.85 °C끓는점
2470.85 °C밀도
1850 kg/m³산화 상태
0, +1, +2전기 음성도(Pauling)
1.57제1 이온화 에너지
9.322699 eV발견 연도
1797원자 반지름
105 pm상세 정보
Beryllium is a light alkaline earth metal with unusually high stiffness, low density, and a high melting point for its mass. Its chemistry is dominated by the +2 oxidation state, but the small Be²⁺ ion gives many compounds pronounced covalent character. The element is rare in accessible ores, chiefly obtained from beryl and bertrandite, and is technologically important where low mass, dimensional stability, and transparency to X-rays are valuable.
The metal, steel gray in color, has many desirable properties. As one of the lightest of all metals, it has one of the highest melting points of the light metals. Its modulus of elasticity is about one third greater than that of steel. It resists attack by concentrated nitric acid, has excellent thermal conductivity, and is nonmagnetic. It has a high permeability to X-rays and when bombarded by alpha particles, as from radium or polonium, neutrons are produced in the amount of about 30 neutrons/million alpha particles.
At ordinary temperatures, beryllium resists oxidation in air, although its ability to scratch glass is probably due to the formation of a thin layer of the oxide.
The name derives from the Greek word beryllos for "beryl", a gemstone in which it is found (3BeO×Al2O3×6SiO2).
Beryllium was discovered by the French chemist and pharmacist Nicholas-Louis Vauquelin in beryl and emerald in 1797. The element was first separated in 1828 by the French chemist Antoine-Alexandre-Brutus Bussy and independently by the German chemist Friedrich Wöhler. Because the salts of beryllium have a sweet taste, the element was also known as glucinium from the Greek glykys for "sweet", until IUPAC selected the name beryllium in 1949.
Although emeralds and beryl were known to ancient civilizations, they were first recognized as the same mineral (Be3Al2(SiO3)6) by Abbé Haüy in 1798. Later that year, Louis-Nicholas Vauquelin, a French chemist, discovered that an unknown element was present in emeralds and beryl. Attempts to isolate the new element finally succeeded in 1828 when two chemists, Friedrich Wölhler of Germany and A. Bussy of France, independently produced beryllium by reducing beryllium chloride (BeCl2) with potassium in a platinum crucible. Today, beryllium is primarily obtained from the minerals beryl (Be3Al2(SiO3)6) and bertrandite (4BeO·2SiO2·H2O) through a chemical process or through the electrolysis of a mixture of molten beryllium chloride (BeCl2) and sodium chloride (NaCl).
From the Greek word beryllos, beryl; also called glucinium or glucinum, Greek glykys, sweet. Discovered in the oxide form by Vauquelin in both beryl and emeralds in 1798. The metal was isolated in 1828 by Wohler and by Bussy independently by the action of potassium on beryllium chloride.
Pure beryllium is a hard, brittle, steel-gray metal with a metallic luster. It is solid at ordinary conditions and forms a thin, adherent oxide film that helps resist further oxidation in dry air. Powdered or freshly machined material is more reactive and presents greater handling risk.
Beryllium metal is used in specialized aerospace, defense, satellite, and scientific instruments where stiffness, low density, and thermal stability justify its cost and handling controls. Thin beryllium windows transmit X-rays and are used in X-ray tubes and detectors. Copper-beryllium alloys are important for springs, electrical contacts, non-sparking tools, and fatigue-resistant precision parts. Beryllium oxide ceramics are used as electrically insulating but thermally conductive materials in some electronic and microwave components.
Beryllium is relatively transparent to X-rays and is used to make windows for X-ray tubes. When exposed to alpha particles, such as those emitted by radium or polonium, beryllium emits neutrons and is used as a neutron source. Beryllium is also used as a moderator in nuclear reactors.
Beryllium is alloyed with copper (2% beryllium, 98% copper) to form a wear resistant material, known as beryllium bronze, used in gyroscopes and other devices where wear resistance is important. Beryllium is alloyed with nickel (2% beryllium, 98% nickel) to make springs, spot-welding electrodes and non-sparking tools. Other beryllium alloys are used in the windshield, brake disks and other structural components of the space shuttle.
Beryllium oxide (BeO), a compound of beryllium, is used in the nuclear industry and in ceramics.
Beryllium was once known as glucinum, which means sweet, since beryllium and many of its compounds have a sugary taste. Unfortunately for the chemists that discovered this particular property, beryllium and many of its compounds are poisonous and should never be tasted or ingested.
Beryllium is used as an alloying agent in producing beryllium copper, which is extensively used for springs, electrical contacts, spot-welding electrodes, and non-sparking tools. It is applied as a structural material for high-speed aircraft, missiles, spacecraft, and communication satellites. Other uses include windshield frame, brake discs, support beams, and other structural components of the space shuttle.
Because beryllium is relatively transparent to X-rays, ultra-thin Be-foil is finding use in X-ray lithography for reproduction of micro-miniature integrated circuits.
Beryllium is used in nuclear reactors as a reflector or moderator for it has a low thermal neutron absorption cross section.
It is used in gyroscopes, computer parts, and instruments where lightness, stiffness, and dimensional stability are required. The oxide has a very high melting point and is also used in nuclear work and ceramic applications.
Isotopes in Geochronology
Cosmogenic 10Be and 7Be isotopes are produced in the atmosphere, largely by cosmic-ray spallation of nitrogen and oxygen. Because of its relatively short half-life (7Be, half-life t1/2=53 d, compared to that of 10Be, half-life t1/2=1.39×106 a, where the unit symbol “d” stands for day and “a” stands for year), measurements of cosmogenic 7Be, and especially the isotope-amount ratio n(7Be)/n(10Be), have been used to study rates of atmospheric circulation, mixing, formation of aerosols (fine solids or liquids suspended in a gas; e.g. smoke and mist are aerosols), and particle deposition [44] C. E. Jordan, J. E. Dibb, R. C. Finkel. J. Geophys. Res. Atmos.108, (2003).. Cosmogenic atmospheric beryllium isotopes (7Be and 10Be) are deposited on the Earth’s surface, where they accumulate in soils, sediments, and snow while decaying away. Measurements of cosmogenic beryllium isotopes in such deposits are used to explore rates of soil formation, erosion, sedimentation, and snow accumulation on time scales ranging from months (7Be) to millions of years (10Be) [45] J. M. Kaste, S. A. Norton, C. T. Hess. Rev. Mineral. Geochem.50, 271 (2002)., [46] J. A. Graly, P. R. Bierman, L. J. Reusser, M. J. Pavich. Geochim. Cosmochim. Acta.74, 6814 (2010).. The minerals in rocks at the Earth’s surface interact with cosmic rays and form substantial quantities of 10Be and 7Be, thus providing a tool to determine the ages of geologic processes. In some situations, it is possible to estimate “exposure ages” for rocks in eroding terrains [47] P. R. Bierman, M. W. Caffee, P. T. Davis, K. Marsella, M. Pavich, P. Colgan, D. Mickelson, J. Larsen. Rev. Mineral. Geochem.50, 147 (2002)., [48] P. Bierman, E. A. Zen, M. Pavich, L. Reusser. U.S. Geol. Surv. Circ.1264, 191 (2004)., [49] L. Reusser, P. Bierman, M. Pavich, J. Larsen, R. Finkel. Am. J. Sci.306, 69 (2006).. By comparing measured 10Be concentrations with estimated rates of in situ cosmogenic 10Be production, the rate of rock erosion and formation of canyons and other geologic features can be determined (Fig. IUPAC.4.1).
Anthropogenic 10Be was produced by nuclear bomb explosions largely through the reaction of fast neutrons (neutrons produced by nuclear fission having high kinetic energy) with 13C via the 13C (n, alpha) 10Be reaction in atmospheric CO2. Although the quantity of 10Be produced in this way is small, its presence above natural background concentrations in some environmental samples can potentially provide information about bomb-related processes and contamination [50] N. E. Whitehead, S. Endo, K. Tanaka, T. Takatsuji, M. Hoshi, S. Fukutani, R. G. Ditchburn, A. Zondervan. J. Environ. Radioact.99, 260 (2008)..
Beryllium most commonly forms Be²⁺ compounds, although their bonding is often strongly polarizing and partly covalent. Beryllium oxide (BeO) is a refractory ceramic with high thermal conductivity and electrical insulation. Beryllium hydroxide (Be(OH)₂) is amphoteric, dissolving in both acids and strong bases. Beryllium chloride (BeCl₂) is polymeric in the solid state and hydrolyzes readily. Natural beryllium occurs mainly in silicate minerals, especially beryl, with ideal formula Be₃Al₂Si₆O₁₈, and in bertrandite, Be₄Si₂O₇(OH)₂.
See more information at the Beryllium compound page.
Beryllium metal, dusts, fumes, and soluble compounds are highly toxic by inhalation. Occupational exposure can cause sensitization and chronic beryllium disease, a serious immune-mediated lung disorder. Machining, grinding, and high-temperature processing require strict dust and fume control. Solid finished articles are less hazardous if they are not abraded, heated, or otherwise made into respirable material.
Beryllium and its salts are toxic and should be handled with the greatest of care. Beryllium and its compounds should not be tasted to verify the sweetish nature of beryllium (as did early experimenters). The metal, its alloys, and its salts can be handled if certain work codes are observed, but no attempt should be made to work with beryllium before becoming familiar with proper safeguards.
Beryllium is a minor constituent of the continental crust and is concentrated by geological processes into uncommon silicate minerals. It has no known essential biological role. In soils and waters its mobility depends strongly on pH, mineral surfaces, and complexation; it is generally not abundant in natural waters. Environmental releases are mainly associated with mining, ore processing, combustion of some coals, and industrial handling of beryllium-containing materials.
Commercial beryllium supply is limited by the scarcity of workable deposits and by the need for controlled processing because of toxicity. Bertrandite ores in the United States and beryl from several regions have been important feedstocks. Extraction is chemically complex, and much demand is for high-value metal, copper-beryllium master alloys, and beryllium oxide ceramics rather than bulk structural metal. Recycling occurs from manufacturing scrap and selected end-of-life alloys, but health controls and material traceability are significant constraints. Substitution is often possible only with loss of stiffness, conductivity, X-ray transparency, or fatigue performance.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
Beryllium is cosmically scarce because stable nuclei with mass numbers 5 and 8 are absent, limiting its production in ordinary stellar fusion chains. Most natural beryllium is thought to form by cosmic-ray spallation of heavier nuclei such as carbon, nitrogen, and oxygen in interstellar material. It is present in the Solar System only at low abundance compared with neighboring light elements.
- Beryllium has only one stable isotope, ⁹Be.
- Emerald and aquamarine are gem varieties of beryl colored by trace impurities, not by beryllium itself.
- Beryllium windows can pass X-rays while blocking visible light and air.
- Copper-beryllium tools are valued where sparking must be minimized.
- Beryllium oxide combines ceramic insulation with unusually high heat conduction.
이미지
특성
물리적 특성
- 원자 반지름(경험값)
- 105 pm 모든 원소의 원자 반지름(경험값) 비교 →
- 공유 결합 반지름
- 96 pm 모든 원소의 공유 결합 반지름 비교 →
- 반데르발스 반지름
- 153 pm 모든 원소의 반데르발스 반지름 비교 →
- 금속 반지름
- 89 pm 모든 원소의 금속 반지름 비교 →
- 밀도
- 1850 kg/m³ 모든 원소의 밀도 비교 →
- 몰 부피
- 0.005 L/mol
- STP에서의 상
- 고체 모든 원소의 STP에서의 상 비교 →
- 녹는점
- 1286.85 °C 모든 원소의 녹는점 비교 →
- 끓는점
- 2470.85 °C 모든 원소의 끓는점 비교 →
- 열전도율
- 201 W/(m·K) 모든 원소의 열전도율 비교 →
- 비열
- 1.825 J/(g·K) 모든 원소의 비열 비교 →
- 몰 열용량
- 16.443 J/(mol·K) 모든 원소의 몰 열용량 비교 →
- 결정 구조
- 육방 조밀 충전 모든 원소의 결정 구조 비교 →
화학적 특성
- 전기 음성도(Pauling)
- 1.57 모든 원소의 전기 음성도(Pauling) 비교 →
- 전기 음성도(Allen)
- 1.576
- 전자 친화도
- -0.52 eV (음수 값 — 추가 전자를 결합하지 않을 것으로 예측됨)
- 제1 이온화 에너지
- 9.322699 eV 모든 원소의 제1 이온화 에너지 비교 →
- 제2 이온화 에너지
- 18.211213 eV 모든 원소의 제2 이온화 에너지 비교 →
- 제3 이온화 에너지
- 153.896735 eV 모든 원소의 제3 이온화 에너지 비교 →
- 제4 이온화 에너지
- 217.719334 eV 모든 원소의 제4 이온화 에너지 비교 →
- 산화 상태
- 0, +1, +2 모든 원소의 산화 상태 비교 →
- 원자가 전자
- 2 모든 원소의 원자가 전자 비교 →
- 전자 배치
- [He] 2s2
열역학적 특성
- 임계점(온도)
- 4932 °C
- 융해열
- 0.12644453 eV 모든 원소의 융해열 비교 →
- 기화열
- 3.078199 eV 모든 원소의 기화열 비교 →
- 승화열
- 3.358035 eV
- 원자화열
- 3.358035 eV
- 원자화 엔탈피
- 3.358035 eV
핵 특성
- 양성자 수
- 4 모든 원소의 양성자 수 비교 →
- 중성자 수
- 5 모든 원소의 중성자 수 비교 →
- 알려진 동위원소 수
- 12 모든 원소의 알려진 동위원소 수 비교 →
- 안정 동위원소 수
- 1 모든 원소의 안정 동위원소 수 비교 →
- 가장 안정한 동위원소
- Be-9
- 발견 연도
- 1797
존재비
- 존재비(지각)
- 2.8 mg/kg 모든 원소의 존재비(지각) 비교 →
- 존재비(해양)
- 5.6 × 10−6 mg/L 모든 원소의 존재비(해양) 비교 →
결정 구조
- 격자 상수 a
- 229 pm
전자 구조
- 전자껍질별 전자 수
- 2, 2 모든 원소의 전자껍질별 전자 수 비교 →
식별자
- CAS 등록 번호
- 7440-41-7 모든 원소의 CAS 등록 번호 비교 →
- 항 기호
- 1S0
- InChI
- InChI=1S/Be
- InChI 키
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N
전자 배치 측정값
Be: 2s²[He] 2s²1s² 2s²원자 모형
동위원소에 따라 중성자 수, 질량, 안정성은 달라지지만, 중성 원자의 전자 배치는 달라지지 않습니다.
개략적인 원자 모형이며 실제 비율과 다릅니다.
원자 지문
방출 / 흡수 스펙트럼
동위원소 분포
| 질량수 | 원자 질량(u) | 천연 존재비 | 반감기 |
|---|---|---|---|
| 9 안정 | 9.012183065 ± 0.000000082 | 100.0000% | 안정 |
상 / 상태
이유: 녹는점(1286.85 °C)보다 1261.8 °C 낮음
개략도이며 실제 비율과 다름
상전이점
전이 에너지
녹는점에서 1 mol을 녹이는 데 필요한 에너지
끓는점에서 1 mol을 기화시키는 데 필요한 에너지
승화점에서 1 mol을 승화시키는 데 필요한 에너지
밀도
표준 조건에서
표준 조건에서
심화
원자 스펙트럼
보유 스펙트럼선 데이터 ?
| 이온 | 전하 | 총 스펙트럼선 수 | 전이 확률 | 준위 표기 |
|---|---|---|---|---|
| Be I | 0 | 581 | 394 | 581 |
| Be II | +1 | 681 | 149 | 681 |
| Be III | +2 | 323 | 302 | 316 |
| Be IV | +3 | 142 | 142 | 142 |
이온 반지름
| 전하 | 배위 | 스핀 | 반지름 |
|---|---|---|---|
| +2 | 3 | 해당 없음 | 16 pm |
| +2 | 4 | 해당 없음 | 27 pm |
| +2 | 6 | 해당 없음 | 45 pm |
화합물
동위원소 (1)
| 질량수 | 원자 질량(u) | 천연 존재비 | 반감기 | 붕괴 방식 | |
|---|---|---|---|---|---|
| 9 안정 | 9.012183065 ± 0.000000082 | 100.0000% | 안정 | stable |
스펙트럼선
| 파장(nm) | 세기 | 이온화 단계 | 유형 | 전이 | 정확도 | 출처 | |
|---|---|---|---|---|---|---|---|
| 381.3453 nm | 22 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4d 1D | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 385.17 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 측정값 | NIST | |
| 386.513 nm | 3 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 386.5427 nm | 5 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 386.5517 nm | 1 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 386.5725 nm | 2 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 386.6022 nm | 해당 없음 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 386.6037 nm | 해당 없음 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 388.143 nm | 해당 없음 | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 측정값 | NIST | |
| 388.143 nm | 해당 없음 | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 측정값 | NIST | |
| 388.143 nm | 해당 없음 | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 측정값 | NIST | |
| 399.55 nm | 해당 없음 | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 측정값 | NIST | |
| 399.55 nm | 해당 없음 | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 측정값 | NIST | |
| 399.55 nm | 해당 없음 | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 403.93 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 측정값 | NIST | |
| 416.63 nm | 해당 없음 | Be III | emission | 1s.4s 1S → 1s.5p 1P* | 측정값 | NIST | |
| 419.97 nm | 해당 없음 | Be III | emission | 1s.4s 1S → 1s.5d 1D | 측정값 | NIST | |
| 424.41 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 1D | 측정값 | NIST | |
| 424.41 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 1D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 424.906 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 측정값 | NIST | |
| 425.2 nm | 해당 없음 | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 측정값 | NIST | |
| 425.2 nm | 해당 없음 | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 측정값 | NIST | |
| 425.2 nm | 해당 없음 | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 측정값 | NIST | |
| 425.2987 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 425.2987 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 425.2987 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 425.3707 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 425.3707 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 425.4085 nm | 해당 없음 | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 432.953 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 측정값 | NIST | |
| 433.302 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 측정값 | NIST | |
| 433.306 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 측정값 | NIST | |
| 433.306 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 측정값 | NIST | |
| 436.0665 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 측정값 | NIST | |
| 436.0986 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 측정값 | NIST | |
| 436.1032 nm | 해당 없음 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 437.112 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 측정값 | NIST | |
| 440.393 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 측정값 | NIST | |
| 440.408 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 측정값 | NIST | |
| 440.408 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 측정값 | NIST | |
| 440.7936 nm | 19 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4s 1S | 측정값 | NIST | |
| 445.828 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5p 1P* | 측정값 | NIST | |
| 446.786 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | 측정값 | NIST | |
| 446.802 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | 측정값 | NIST | |
| 447.669 nm | 해당 없음 | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | 측정값 | NIST | |
| 447.672 nm | 해당 없음 | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 1F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 1F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 448.651 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 측정값 | NIST | |
| 449.54 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5f 1F* | 측정값 | NIST | |
| 449.54 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5f 3F* | 측정값 | NIST | |
| 449.54 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5f 3F* | 측정값 | NIST | |
| 449.96 nm | 해당 없음 | Be III | emission | 1s.4f 1F* → 1s.5d 1D | 측정값 | NIST | |
| 449.96 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 1D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 1F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 1F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 450.511 nm | 해당 없음 | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 측정값 | NIST | |
| 452.6406 nm | 7 | Be I | emission | 1s2.2s.4p 1P* → 1s2.2p.3p 1P | 측정값 | NIST | |
| 453.543 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 측정값 | NIST | |
| 453.548 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 측정값 | NIST | |
| 453.548 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 측정값 | NIST | |
| 453.58 nm | 해당 없음 | Be III | emission | 1s.4p 1P* → 1s.5p 1P* | 측정값 | NIST | |
| 454.06 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 측정값 | NIST | |
| 454.062 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 측정값 | NIST | |
| 454.062 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 측정값 | NIST | |
| 454.788 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 측정값 | NIST | |
| 454.789 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 측정값 | NIST | |
| 454.793 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 측정값 | NIST | |
| 454.8055 nm | 해당 없음 | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | 측정값 | NIST | |
| 454.85379 nm | 해당 없음 | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | 측정값 | NIST | |
| 457.266603 nm | 30 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.3d 1D | 측정값 | NIST | |
| 457.55 nm | 해당 없음 | Be III | emission | 1s.4p 1P* → 1s.5d 1D | 측정값 | NIST | |
| 458.12 nm | 해당 없음 | Be III | emission | 1s.4p 1P* → 1s.5d 3D | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 459.61 nm | 해당 없음 | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 461.05 nm | 해당 없음 | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 462.827 nm | 해당 없음 | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 측정값 | NIST | |
| 463.774 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5p 3P* | 측정값 | NIST | |
| 463.774 nm | 해당 없음 | Be III | emission | 1s.4d 1D → 1s.5p 3P* | 측정값 | NIST | |
| 465.722198 nm | 해당 없음 | Be IV | emission | 5p 2P* → 6d 2D | 측정값 | NIST | |
| 465.730484 nm | 해당 없음 | Be IV | emission | 5s 2S → 6p 2P* | 측정값 | NIST | |
| 465.792545 nm | 해당 없음 | Be IV | emission | 5p 2P* → 6s 2S | 측정값 | NIST | |
| 465.805836 nm | 해당 없음 | Be IV | emission | 5s 2S → 6p 2P* | 측정값 | NIST | |
| 465.827127 nm | 해당 없음 | Be IV | emission | 5d 2D → 6f 2F* | 측정값 | NIST | |
| 465.827302 nm | 해당 없음 | Be IV | emission | 5p 2P* → 6d 2D | 측정값 | NIST | |
| 465.85207 nm | 해당 없음 | Be IV | emission | 5d 2D → 6p 2P* | 측정값 | NIST | |
| 465.852419 nm | 해당 없음 | Be IV | emission | 5p 2P* → 6d 2D | 측정값 | NIST | |
| 465.857919 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6g 2G | 측정값 | NIST | |
| 465.857973 nm | 해당 없음 | Be IV | emission | 5d 2D → 6f 2F* | 측정값 | NIST | |
| 465.870408 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6d 2D | 측정값 | NIST | |
| 465.870532 nm | 해당 없음 | Be IV | emission | 5d 2D → 6f 2F* | 측정값 | NIST | |
| 465.872059 nm | 해당 없음 | Be IV | emission | 5g 2G → 6h 2H* | 측정값 | NIST | |
| 465.872085 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6g 2G | 측정값 | NIST | |
| 465.879556 nm | 해당 없음 | Be IV | emission | 5g 2G → 6f 2F* | 측정값 | NIST | |
| 465.879621 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6g 2G | 측정값 | NIST | |
| 465.8800567 nm | 해당 없음 | Be IV | emission | 5g 2G → 6h 2H* | 측정값 | NIST | |
| 465.8850804 nm | 해당 없음 | Be IV | emission | 5g 2G → 6h 2H* | 측정값 | NIST | |
| 465.892111 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6d 2D | 측정값 | NIST | |
| 465.892116 nm | 해당 없음 | Be IV | emission | 5g 2G → 6f 2F* | 측정값 | NIST | |
| 465.892578 nm | 해당 없음 | Be IV | emission | 5g 2G → 6f 2F* | 측정값 | NIST | |
| 465.89548 nm | 해당 없음 | Be IV | emission | 5d 2D → 6p 2P* | 측정값 | NIST | |
| 465.89553 nm | 해당 없음 | Be IV | emission | 5f 2F* → 6d 2D | 측정값 | NIST | |
| 465.9228055 nm | 해당 없음 | Be IV | emission | 5p 2P* → 6s 2S | 측정값 | NIST | |
| 465.927462 nm | 해당 없음 | Be IV | emission | 5d 2D → 6p 2P* | 측정값 | NIST | |
| 466.346 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 측정값 | NIST | |
| 466.346 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 측정값 | NIST | |
| 466.346 nm | 해당 없음 | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 466.37 nm | 해당 없음 | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 측정값 | NIST | |
| 467.3332 nm | 1060 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 측정값 | NIST | |
| 467.342 nm | 1160 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 측정값 | NIST | |
| 467.345 nm | 해당 없음 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 측정값 | NIST | |
| 470.234 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 측정값 | NIST | |
| 470.252 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 측정값 | NIST | |
| 470.252 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 측정값 | NIST | |
| 470.9391 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 측정값 | NIST | |
| 470.9394 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 측정값 | NIST | |
| 470.9396 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 측정값 | NIST | |
| 480.759 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | 측정값 | NIST | |
| 480.777 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | 측정값 | NIST | |
| 482.799 nm | 해당 없음 | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 측정값 | NIST | |
| 482.812 nm | 해당 없음 | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 측정값 | NIST | |
| 482.818 nm | 해당 없음 | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 측정값 | NIST | |
| 484.9153 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 측정값 | NIST | |
| 484.9153 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 측정값 | NIST | |
| 484.9156 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 측정값 | NIST | |
| 485.233 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 측정값 | NIST | |
| 485.238 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 측정값 | NIST | |
| 485.238 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 측정값 | NIST | |
| 485.6045 nm | 해당 없음 | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 측정값 | NIST | |
| 485.61897 nm | 해당 없음 | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 측정값 | NIST | |
| 485.61897 nm | 해당 없음 | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 측정값 | NIST | |
| 485.6741 nm | 해당 없음 | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 측정값 | NIST | |
| 485.6741 nm | 해당 없음 | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 측정값 | NIST | |
| 485.82 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 측정값 | NIST | |
| 485.823 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 측정값 | NIST | |
| 485.823 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 측정값 | NIST | |
| 508.7714 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 측정값 | NIST | |
| 508.7714 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 측정값 | NIST | |
| 508.7719 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 측정값 | NIST | |
| 515.2 nm | 해당 없음 | Be III | emission | 1s.5d 1D → 1s.7p 1P* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 515.778 nm | 해당 없음 | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 측정값 | NIST | |
| 516.51 nm | 해당 없음 | Be III | emission | 1s.5d 1D → 1s.7f 3F* | 측정값 | NIST | |
| 516.51 nm | 해당 없음 | Be III | emission | 1s.5d 1D → 1s.7f 3F* | 측정값 | NIST | |
| 521.8119 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 측정값 | NIST | |
| 521.834 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 측정값 | NIST | |
| 521.834 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 측정값 | NIST | |
| 525.007 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.9p 1P* | 측정값 | NIST | |
| 525.584 nm | 해당 없음 | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | 측정값 | NIST | |
| 525.59 nm | 해당 없음 | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | 측정값 | NIST | |
| 526.1527 nm | 5 | Be I | emission | 1s2.2s.5p 1P* → 1s2.2p.3p 1P | 측정값 | NIST | |
| 527.027 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | 측정값 | NIST | |
| 527.0806 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | 측정값 | NIST | |
| 536.552 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.8p 1P* | 측정값 | NIST | |
| 540.299 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 측정값 | NIST | |
| 540.306 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 측정값 | NIST | |
| 540.306 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 측정값 | NIST | |
| 541.018 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 측정값 | NIST | |
| 541.022 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 측정값 | NIST | |
| 541.022 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 측정값 | NIST | |
| 541.612 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | 측정값 | NIST | |
| 541.636 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | 측정값 | NIST | |
| 544.069 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 측정값 | NIST | |
| 544.073 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 측정값 | NIST | |
| 544.076 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 측정값 | NIST | |
| 554.648 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.7p 1P* | 측정값 | NIST | |
| 555.881 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 측정값 | NIST | |
| 555.881 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 측정값 | NIST | |
| 555.881 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 측정값 | NIST | |
| 585.7012 nm | 3 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.6p 1P* | 측정값 | NIST | |
| 593.771 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.9p 1P* | 측정값 | NIST | |
| 608.58 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 1P* | 측정값 | NIST | |
| 608.6 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 3P* | 측정값 | NIST | |
| 614.2 nm | 해당 없음 | Be III | emission | 1s.2s 1S → 1s.2p 1P* | 측정값 | NIST | |
| 622.9108 nm | 3 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7f 1F* | 측정값 | NIST | |
| 627.9418 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 측정값 | NIST | |
| 627.9737 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 측정값 | NIST | |
| 627.9737 nm | 해당 없음 | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 측정값 | NIST | |
| 631.966 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 1P* | 측정값 | NIST | |
| 632.145 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 3P* | 측정값 | NIST | |
| 647.3536 nm | 7 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.5p 1P* | 측정값 | NIST | |
| 654.784 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 측정값 | NIST | |
| 654.793 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 측정값 | NIST | |
| 654.794 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 측정값 | NIST | |
| 655.833 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 측정값 | NIST | |
| 655.839 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 측정값 | NIST | |
| 655.839 nm | 해당 없음 | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 측정값 | NIST | |
| 656.4519 nm | 9 | Be I | emission | 1s2.2p2 1D → 1s2.2s.6f 1F* | 측정값 | NIST | |
| 663.633 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 측정값 | NIST | |
| 663.644 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 측정값 | NIST | |
| 663.644 nm | 해당 없음 | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 측정값 | NIST | |
| 671.15 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 671.21 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 671.23 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 671.25 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 671.25 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 671.26 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 측정값 | NIST | |
| 672.598 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.6p 1P* | 측정값 | NIST | |
| 675.675 nm | 10 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | 측정값 | NIST | |
| 675.712 nm | 110 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | 측정값 | NIST | |
| 678.656 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 측정값 | NIST | |
| 678.656 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 측정값 | NIST | |
| 678.656 nm | 해당 없음 | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 측정값 | NIST | |
| 688.422 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 688.422 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 688.423 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 688.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 688.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 688.444 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 측정값 | NIST | |
| 698.273 nm | 13 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2p2 1D | 측정값 | NIST | |
| 704.98 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 측정값 | NIST | |
| 704.98 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 측정값 | NIST | |
| 705 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 측정값 | NIST | |
| 715.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 715.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 715.441 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 715.459 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 715.46 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 715.465 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 측정값 | NIST | |
| 720.9132 nm | 13 | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 1F* | 측정값 | NIST | |
| 720.928 nm | 해당 없음 | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 3F* | 측정값 | NIST | |
| 730.819 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9d 1D | 측정값 | NIST | |
| 740.1196 nm | 210 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | 측정값 | NIST | |
| 740.1431 nm | 110 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | 측정값 | NIST | |
| 743.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 측정값 | NIST | |
| 743.44 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 측정값 | NIST | |
| 743.46 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 측정값 | NIST | |
| 744.887 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9s 1S | 측정값 | NIST | |
| 749.842 nm | 해당 없음 | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.8d 1D | 측정값 | NIST |
확장 특성
공유 결합 반지름(확장)
- 공유 결합 반지름(Pyykkö)
- 102 pm
- 공유 결합 반지름(Pyykkö, 이중 결합)
- 90 pm
- 공유 결합 반지름(Pyykkö, 삼중 결합)
- 85 pm
- 공유 결합 반지름(Bragg)
- 115 pm
반데르발스 반지름
- Truhlar
- 153 pm
- Batsanov
- 190 pm
- Alvarez
- 198 pm
- UFF
- 274.5 pm
- MM3
- 223 pm
원자 및 금속 반지름
- 원자 반지름(Rahm)
- 219 pm
- 금속 반지름(C12)
- 112 pm
번호 척도
- Mendeleev
- 75
- Pettifor
- 77
- Glawe
- 77
전기 음성도 척도
- Ghosh
- 0
- Miedema
- 5
- Gunnarsson–Lundqvist
- 4
- Robles–Bartolotti
- 4
분극률 및 분산
- 쌍극자 분극률
- 37.74 a.u.
- 쌍극자 분극률(불확도)
- 0.03 a.u.
- C₆
- 227 Ha·Bohr6
- C₆ (Gould–Bučko)
- 214 Ha·Bohr6
미데마 매개변수
- 미데마 몰 부피
- 4.9 cm3/mol
- 미데마 전자 밀도
- 5
공급 위험 및 경제성
- 생산 집중도
- 85
- 상대적 공급 위험
- 8
- 정치적 안정성(최대 생산국)
- 57
상전이 및 동소체
| 녹는점 | 1560.15 K |
| 끓는점 | 2741.15 K |
| 임계점(온도) | 5205.15 K |
산화 상태 분류
심화 참고 데이터
차폐 상수 (2)
| n | 오비탈 | σ |
|---|---|---|
| 1 | s | 0.3152 |
| 2 | s | 2.088 |
결정 반지름 상세 정보 (3)
| 전하 | CN | 스핀 | rcrystal (pm) | 기원 |
|---|---|---|---|---|
| 2 | III | 30 | ||
| 2 | IV | 41 | ||
| 2 | VI | 59 | calculated, |
동위원소 붕괴 방식 (19)
| 동위원소 | 모드 | 세기 |
|---|---|---|
| 5 | p | — |
| 6 | 2p | 100% |
| 7 | EC | 100% |
| 8 | A | 100% |
| 10 | B- | 100% |
| 11 | B- | 100% |
| 11 | B-A | 3.3% |
| 11 | B-p | 0% |
| 11 | B-n | — |
| 12 | B- | 100% |
X선 산란 인자 (724)
| 에너지 (eV) | f₁ | f₂ |
|---|---|---|
| 10 | — | 1.70333 |
| 10.1617 | — | 1.71802 |
| 10.3261 | — | 1.73284 |
| 10.4931 | — | 1.74778 |
| 10.6628 | — | 1.75737 |
| 10.8353 | — | 1.76678 |
| 11.0105 | — | 1.77624 |
| 11.1886 | — | 1.78574 |
| 11.3696 | — | 1.7953 |
| 11.5535 | — | 1.80306 |
추가 데이터
Estimated Crustal Abundance
The estimated element abundance in the earth's crust.
2.8 milligrams per kilogram
참고 문헌 (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Estimated Oceanic Abundance
The estimated element abundance in the earth's oceans.
5.6×10-6 milligrams per liter
참고 문헌 (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Sources
Sources of this element.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
참고 문헌 (1)
- [6] Beryllium https://periodic.lanl.gov/4.shtml
참고 문헌
(9)
Data deposited in or computed by PubChem
The half-life and atomic mass data was provided by the Atomic Mass Data Center at the International Atomic Energy Agency.
Element data are cited from the Atomic weights of the elements (an IUPAC Technical Report). The IUPAC periodic table of elements can be found at https://iupac.org/what-we-do/periodic-table-of-elements/. Additional information can be found within IUPAC publication doi:10.1515/pac-2015-0703 Copyright © 2020 International Union of Pure and Applied Chemistry.
The information are cited from Pure Appl. Chem. 2018; 90(12): 1833-2092, https://doi.org/10.1515/pac-2015-0703.
Thomas Jefferson National Accelerator Facility (Jefferson Lab) is one of 17 national laboratories funded by the U.S. Department of Energy. The lab's primary mission is to conduct basic research of the atom's nucleus using the lab's unique particle accelerator, known as the Continuous Electron Beam Accelerator Facility (CEBAF). For more information visit https://www.jlab.org/
The periodic table at the LANL (Los Alamos National Laboratory) contains basic element information together with the history, source, properties, use, handling and more. The provenance data may be found from the link under the source name.
The periodic table contains NIST's critically-evaluated data on atomic properties of the elements. The provenance data that include data for atomic spectroscopy, X-ray and gamma ray, radiation dosimetry, nuclear physics, and condensed matter physics may be found from the link under the source name. Ref: https://www.nist.gov/pml/atomic-spectra-database
This section provides all form of data related to element Beryllium.
The element property data was retrieved from publications.