Beryllium (Be)
alkaline-earth-metalSolid
標準原子量
9.012183 u電子配置
[He] 2s2融点
1286.85 °C沸点
2470.85 °C密度
1850 kg/m³酸化数
0, +1, +2電気陰性度（Pauling）
1.57第1イオン化エネルギー
9.322699 eV発見年
1797原子半径
105 pm詳細
Beryllium is a light alkaline earth metal with unusually high stiffness, low density, and a high melting point for its mass. Its chemistry is dominated by the +2 oxidation state, but the small Be²⁺ ion gives many compounds pronounced covalent character. The element is rare in accessible ores, chiefly obtained from beryl and bertrandite, and is technologically important where low mass, dimensional stability, and transparency to X-rays are valuable.
The metal, steel gray in color, has many desirable properties. As one of the lightest of all metals, it has one of the highest melting points of the light metals. Its modulus of elasticity is about one third greater than that of steel. It resists attack by concentrated nitric acid, has excellent thermal conductivity, and is nonmagnetic. It has a high permeability to X-rays and when bombarded by alpha particles, as from radium or polonium, neutrons are produced in the amount of about 30 neutrons/million alpha particles.
At ordinary temperatures, beryllium resists oxidation in air, although its ability to scratch glass is probably due to the formation of a thin layer of the oxide.
The name derives from the Greek word beryllos for "beryl", a gemstone in which it is found (3BeO×Al2O3×6SiO2).
Beryllium was discovered by the French chemist and pharmacist Nicholas-Louis Vauquelin in beryl and emerald in 1797. The element was first separated in 1828 by the French chemist Antoine-Alexandre-Brutus Bussy and independently by the German chemist Friedrich Wöhler. Because the salts of beryllium have a sweet taste, the element was also known as glucinium from the Greek glykys for "sweet", until IUPAC selected the name beryllium in 1949.
Although emeralds and beryl were known to ancient civilizations, they were first recognized as the same mineral (Be3Al2(SiO3)6) by Abbé Haüy in 1798. Later that year, Louis-Nicholas Vauquelin, a French chemist, discovered that an unknown element was present in emeralds and beryl. Attempts to isolate the new element finally succeeded in 1828 when two chemists, Friedrich Wölhler of Germany and A. Bussy of France, independently produced beryllium by reducing beryllium chloride (BeCl2) with potassium in a platinum crucible. Today, beryllium is primarily obtained from the minerals beryl (Be3Al2(SiO3)6) and bertrandite (4BeO·2SiO2·H2O) through a chemical process or through the electrolysis of a mixture of molten beryllium chloride (BeCl2) and sodium chloride (NaCl).
From the Greek word beryllos, beryl; also called glucinium or glucinum, Greek glykys, sweet. Discovered in the oxide form by Vauquelin in both beryl and emeralds in 1798. The metal was isolated in 1828 by Wohler and by Bussy independently by the action of potassium on beryllium chloride.
Pure beryllium is a hard, brittle, steel-gray metal with a metallic luster. It is solid at ordinary conditions and forms a thin, adherent oxide film that helps resist further oxidation in dry air. Powdered or freshly machined material is more reactive and presents greater handling risk.
Beryllium metal is used in specialized aerospace, defense, satellite, and scientific instruments where stiffness, low density, and thermal stability justify its cost and handling controls. Thin beryllium windows transmit X-rays and are used in X-ray tubes and detectors. Copper-beryllium alloys are important for springs, electrical contacts, non-sparking tools, and fatigue-resistant precision parts. Beryllium oxide ceramics are used as electrically insulating but thermally conductive materials in some electronic and microwave components.
Beryllium is relatively transparent to X-rays and is used to make windows for X-ray tubes. When exposed to alpha particles, such as those emitted by radium or polonium, beryllium emits neutrons and is used as a neutron source. Beryllium is also used as a moderator in nuclear reactors.
Beryllium is alloyed with copper (2% beryllium, 98% copper) to form a wear resistant material, known as beryllium bronze, used in gyroscopes and other devices where wear resistance is important. Beryllium is alloyed with nickel (2% beryllium, 98% nickel) to make springs, spot-welding electrodes and non-sparking tools. Other beryllium alloys are used in the windshield, brake disks and other structural components of the space shuttle.
Beryllium oxide (BeO), a compound of beryllium, is used in the nuclear industry and in ceramics.
Beryllium was once known as glucinum, which means sweet, since beryllium and many of its compounds have a sugary taste. Unfortunately for the chemists that discovered this particular property, beryllium and many of its compounds are poisonous and should never be tasted or ingested.
Beryllium is used as an alloying agent in producing beryllium copper, which is extensively used for springs, electrical contacts, spot-welding electrodes, and non-sparking tools. It is applied as a structural material for high-speed aircraft, missiles, spacecraft, and communication satellites. Other uses include windshield frame, brake discs, support beams, and other structural components of the space shuttle.
Because beryllium is relatively transparent to X-rays, ultra-thin Be-foil is finding use in X-ray lithography for reproduction of micro-miniature integrated circuits.
Beryllium is used in nuclear reactors as a reflector or moderator for it has a low thermal neutron absorption cross section.
It is used in gyroscopes, computer parts, and instruments where lightness, stiffness, and dimensional stability are required. The oxide has a very high melting point and is also used in nuclear work and ceramic applications.
Isotopes in Geochronology
Cosmogenic 10Be and 7Be isotopes are produced in the atmosphere, largely by cosmic-ray spallation of nitrogen and oxygen. Because of its relatively short half-life (7Be, half-life t1/2=53 d, compared to that of 10Be, half-life t1/2=1.39×106 a, where the unit symbol “d” stands for day and “a” stands for year), measurements of cosmogenic 7Be, and especially the isotope-amount ratio n(7Be)/n(10Be), have been used to study rates of atmospheric circulation, mixing, formation of aerosols (fine solids or liquids suspended in a gas; e.g. smoke and mist are aerosols), and particle deposition [44] C. E. Jordan, J. E. Dibb, R. C. Finkel. J. Geophys. Res. Atmos.108, (2003).. Cosmogenic atmospheric beryllium isotopes (7Be and 10Be) are deposited on the Earth’s surface, where they accumulate in soils, sediments, and snow while decaying away. Measurements of cosmogenic beryllium isotopes in such deposits are used to explore rates of soil formation, erosion, sedimentation, and snow accumulation on time scales ranging from months (7Be) to millions of years (10Be) [45] J. M. Kaste, S. A. Norton, C. T. Hess. Rev. Mineral. Geochem.50, 271 (2002)., [46] J. A. Graly, P. R. Bierman, L. J. Reusser, M. J. Pavich. Geochim. Cosmochim. Acta.74, 6814 (2010).. The minerals in rocks at the Earth’s surface interact with cosmic rays and form substantial quantities of 10Be and 7Be, thus providing a tool to determine the ages of geologic processes. In some situations, it is possible to estimate “exposure ages” for rocks in eroding terrains [47] P. R. Bierman, M. W. Caffee, P. T. Davis, K. Marsella, M. Pavich, P. Colgan, D. Mickelson, J. Larsen. Rev. Mineral. Geochem.50, 147 (2002)., [48] P. Bierman, E. A. Zen, M. Pavich, L. Reusser. U.S. Geol. Surv. Circ.1264, 191 (2004)., [49] L. Reusser, P. Bierman, M. Pavich, J. Larsen, R. Finkel. Am. J. Sci.306, 69 (2006).. By comparing measured 10Be concentrations with estimated rates of in situ cosmogenic 10Be production, the rate of rock erosion and formation of canyons and other geologic features can be determined (Fig. IUPAC.4.1).
Anthropogenic 10Be was produced by nuclear bomb explosions largely through the reaction of fast neutrons (neutrons produced by nuclear fission having high kinetic energy) with 13C via the 13C (n, alpha) 10Be reaction in atmospheric CO2. Although the quantity of 10Be produced in this way is small, its presence above natural background concentrations in some environmental samples can potentially provide information about bomb-related processes and contamination [50] N. E. Whitehead, S. Endo, K. Tanaka, T. Takatsuji, M. Hoshi, S. Fukutani, R. G. Ditchburn, A. Zondervan. J. Environ. Radioact.99, 260 (2008)..
Beryllium most commonly forms Be²⁺ compounds, although their bonding is often strongly polarizing and partly covalent. Beryllium oxide (BeO) is a refractory ceramic with high thermal conductivity and electrical insulation. Beryllium hydroxide (Be(OH)₂) is amphoteric, dissolving in both acids and strong bases. Beryllium chloride (BeCl₂) is polymeric in the solid state and hydrolyzes readily. Natural beryllium occurs mainly in silicate minerals, especially beryl, with ideal formula Be₃Al₂Si₆O₁₈, and in bertrandite, Be₄Si₂O₇(OH)₂.
See more information at the Beryllium compound page.
Beryllium metal, dusts, fumes, and soluble compounds are highly toxic by inhalation. Occupational exposure can cause sensitization and chronic beryllium disease, a serious immune-mediated lung disorder. Machining, grinding, and high-temperature processing require strict dust and fume control. Solid finished articles are less hazardous if they are not abraded, heated, or otherwise made into respirable material.
Beryllium and its salts are toxic and should be handled with the greatest of care. Beryllium and its compounds should not be tasted to verify the sweetish nature of beryllium (as did early experimenters). The metal, its alloys, and its salts can be handled if certain work codes are observed, but no attempt should be made to work with beryllium before becoming familiar with proper safeguards.
Beryllium is a minor constituent of the continental crust and is concentrated by geological processes into uncommon silicate minerals. It has no known essential biological role. In soils and waters its mobility depends strongly on pH, mineral surfaces, and complexation; it is generally not abundant in natural waters. Environmental releases are mainly associated with mining, ore processing, combustion of some coals, and industrial handling of beryllium-containing materials.
Commercial beryllium supply is limited by the scarcity of workable deposits and by the need for controlled processing because of toxicity. Bertrandite ores in the United States and beryl from several regions have been important feedstocks. Extraction is chemically complex, and much demand is for high-value metal, copper-beryllium master alloys, and beryllium oxide ceramics rather than bulk structural metal. Recycling occurs from manufacturing scrap and selected end-of-life alloys, but health controls and material traceability are significant constraints. Substitution is often possible only with loss of stiffness, conductivity, X-ray transparency, or fatigue performance.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
Beryllium is cosmically scarce because stable nuclei with mass numbers 5 and 8 are absent, limiting its production in ordinary stellar fusion chains. Most natural beryllium is thought to form by cosmic-ray spallation of heavier nuclei such as carbon, nitrogen, and oxygen in interstellar material. It is present in the Solar System only at low abundance compared with neighboring light elements.
- Beryllium has only one stable isotope, ⁹Be.
- Emerald and aquamarine are gem varieties of beryl colored by trace impurities, not by beryllium itself.
- Beryllium windows can pass X-rays while blocking visible light and air.
- Copper-beryllium tools are valued where sparking must be minimized.
- Beryllium oxide combines ceramic insulation with unusually high heat conduction.
画像
性質
物理的性質
- 原子半径（経験値）
- 105 pm 全元素の原子半径（経験値）を比較 →
- 共有結合半径
- 96 pm 全元素の共有結合半径を比較 →
- ファンデルワールス半径
- 153 pm 全元素のファンデルワールス半径を比較 →
- 金属半径
- 89 pm 全元素の金属半径を比較 →
- 密度
- 1850 kg/m³ 全元素の密度を比較 →
- モル体積
- 0.005 L/mol
- 標準温度・圧力（STP）での相
- 固体 全元素の標準温度・圧力（STP）での相を比較 →
- 融点
- 1286.85 °C 全元素の融点を比較 →
- 沸点
- 2470.85 °C 全元素の沸点を比較 →
- 熱伝導率
- 201 W/(m·K) 全元素の熱伝導率を比較 →
- 比熱容量
- 1.825 J/(g·K) 全元素の比熱容量を比較 →
- モル熱容量
- 16.443 J/(mol·K) 全元素のモル熱容量を比較 →
- 結晶構造
- 六方最密充填構造 全元素の結晶構造を比較 →
化学的性質
- 電気陰性度（Pauling）
- 1.57 全元素の電気陰性度（Pauling）を比較 →
- 電気陰性度（Allen）
- 1.576
- 電子親和力
- -0.52 eV (負の値—この原子は電子を取り込まないと予測される)
- 第1イオン化エネルギー
- 9.322699 eV 全元素の第1イオン化エネルギーを比較 →
- 第2イオン化エネルギー
- 18.211213 eV 全元素の第2イオン化エネルギーを比較 →
- 第3イオン化エネルギー
- 153.896735 eV 全元素の第3イオン化エネルギーを比較 →
- 第4イオン化エネルギー
- 217.719334 eV 全元素の第4イオン化エネルギーを比較 →
- 酸化数
- 0, +1, +2 全元素の酸化数を比較 →
- 価電子
- 2 全元素の価電子を比較 →
- 電子配置
- [He] 2s2
熱力学的性質
- 臨界点（温度）
- 4932 °C
- 融解熱
- 0.12644453 eV 全元素の融解熱を比較 →
- 蒸発熱
- 3.078199 eV 全元素の蒸発熱を比較 →
- 昇華熱
- 3.358035 eV
- 原子化熱
- 3.358035 eV
- 原子化エンタルピー
- 3.358035 eV
原子核
- 陽子数
- 4 全元素の陽子数を比較 →
- 中性子数
- 5 全元素の中性子数を比較 →
- 既知の同位体
- 12 全元素の既知の同位体を比較 →
- 安定同位体
- 1 全元素の安定同位体を比較 →
- 最も安定な同位体
- Be-9
- 発見年
- 1797
存在度
- 存在度（地殻）
- 2.8 mg/kg 全元素の存在度（地殻）を比較 →
- 存在度（海洋）
- 5.6 × 10−6 mg/L 全元素の存在度（海洋）を比較 →
結晶構造
- 格子定数a
- 229 pm
電子構造
- 各電子殻の電子数
- 2, 2 全元素の各電子殻の電子数を比較 →
識別子
- CAS登録番号
- 7440-41-7 全元素のCAS登録番号を比較 →
- 項記号
- 1S0
- InChI
- InChI=1S/Be
- InChI Key
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N
電子配置 測定値
Be: 2s²[He] 2s²1s² 2s²原子モデル
同位体によって中性子数、質量、安定性は変わりますが、中性原子の電子配置は変わりません。
模式的な原子モデルです。実際の縮尺とは異なります。
原子の指紋
発光／吸収スペクトル
同位体分布
| 質量数 | 原子質量（u） | 天然存在比 | 半減期 |
|---|---|---|---|
| 9 安定 | 9.012183065 ± 0.000000082 | 100.0000% | 安定 |
相／状態
理由: 融点（1286.85 °C）より1261.8 °C低い
模式図、実際の縮尺とは異なります
相転移点
相転移エネルギー
融点で1 molを融解させるのに必要なエネルギー
沸点で1 molを蒸発させるのに必要なエネルギー
昇華点で1 molを昇華させるのに必要なエネルギー
密度
標準条件下
標準条件下
詳細
原子スペクトル
スペクトル線データの収録状況 ?
| イオン | 電荷 | スペクトル線の総数 | 遷移確率 | 準位の表記 |
|---|---|---|---|---|
| Be I | 0 | 581 | 394 | 581 |
| Be II | +1 | 681 | 149 | 681 |
| Be III | +2 | 323 | 302 | 316 |
| Be IV | +3 | 142 | 142 | 142 |
イオン半径
| 電荷 | 配位 | スピン | 半径 |
|---|---|---|---|
| +2 | 3 | データなし | 16 pm |
| +2 | 4 | データなし | 27 pm |
| +2 | 6 | データなし | 45 pm |
化合物
同位体 (1)
| 質量数 | 原子質量（u） | 天然存在比 | 半減期 | 崩壊形式 | |
|---|---|---|---|---|---|
| 9 安定 | 9.012183065 ± 0.000000082 | 100.0000% | 安定 | stable |
スペクトル線
| 波長（nm） | 強度 | 電離段階 | 種類 | 遷移 | 精度 | 出典 | |
|---|---|---|---|---|---|---|---|
| 381.3453 nm | 22 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4d 1D | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 385.17 nm | データなし | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | 測定値 | NIST | |
| 386.513 nm | 3 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 386.5427 nm | 5 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 386.5517 nm | 1 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 386.5725 nm | 2 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 386.6022 nm | データなし | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 386.6037 nm | データなし | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 388.143 nm | データなし | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 測定値 | NIST | |
| 388.143 nm | データなし | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 測定値 | NIST | |
| 388.143 nm | データなし | Be III | emission | 1s.4s 3S → 1s.5p 3P* | 測定値 | NIST | |
| 399.55 nm | データなし | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 測定値 | NIST | |
| 399.55 nm | データなし | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 測定値 | NIST | |
| 399.55 nm | データなし | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 403.93 nm | データなし | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | 測定値 | NIST | |
| 416.63 nm | データなし | Be III | emission | 1s.4s 1S → 1s.5p 1P* | 測定値 | NIST | |
| 419.97 nm | データなし | Be III | emission | 1s.4s 1S → 1s.5d 1D | 測定値 | NIST | |
| 424.41 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 1D | 測定値 | NIST | |
| 424.41 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 1D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 424.906 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5d 3D | 測定値 | NIST | |
| 425.2 nm | データなし | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 測定値 | NIST | |
| 425.2 nm | データなし | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 測定値 | NIST | |
| 425.2 nm | データなし | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | 測定値 | NIST | |
| 425.2987 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 425.2987 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 425.2987 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 425.3707 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 425.3707 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 425.4085 nm | データなし | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 432.953 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | 測定値 | NIST | |
| 433.302 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 測定値 | NIST | |
| 433.306 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 測定値 | NIST | |
| 433.306 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | 測定値 | NIST | |
| 436.0665 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 測定値 | NIST | |
| 436.0986 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 測定値 | NIST | |
| 436.1032 nm | データなし | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 437.112 nm | データなし | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | 測定値 | NIST | |
| 440.393 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 440.408 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 440.408 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 440.7936 nm | 19 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4s 1S | 測定値 | NIST | |
| 445.828 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5p 1P* | 測定値 | NIST | |
| 446.786 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | 測定値 | NIST | |
| 446.802 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | 測定値 | NIST | |
| 447.669 nm | データなし | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | 測定値 | NIST | |
| 447.672 nm | データなし | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 1F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 1F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 448.651 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5f 3F* | 測定値 | NIST | |
| 449.54 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5f 1F* | 測定値 | NIST | |
| 449.54 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5f 3F* | 測定値 | NIST | |
| 449.54 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5f 3F* | 測定値 | NIST | |
| 449.96 nm | データなし | Be III | emission | 1s.4f 1F* → 1s.5d 1D | 測定値 | NIST | |
| 449.96 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 1D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 1F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 1F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 450.511 nm | データなし | Be III | emission | 1s.4f 3F* → 1s.5d 3D | 測定値 | NIST | |
| 452.6406 nm | 7 | Be I | emission | 1s2.2s.4p 1P* → 1s2.2p.3p 1P | 測定値 | NIST | |
| 453.543 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 測定値 | NIST | |
| 453.548 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 測定値 | NIST | |
| 453.548 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | 測定値 | NIST | |
| 453.58 nm | データなし | Be III | emission | 1s.4p 1P* → 1s.5p 1P* | 測定値 | NIST | |
| 454.06 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 測定値 | NIST | |
| 454.062 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 測定値 | NIST | |
| 454.062 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | 測定値 | NIST | |
| 454.788 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 454.789 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 454.793 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 454.8055 nm | データなし | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | 測定値 | NIST | |
| 454.85379 nm | データなし | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | 測定値 | NIST | |
| 457.266603 nm | 30 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.3d 1D | 測定値 | NIST | |
| 457.55 nm | データなし | Be III | emission | 1s.4p 1P* → 1s.5d 1D | 測定値 | NIST | |
| 458.12 nm | データなし | Be III | emission | 1s.4p 1P* → 1s.5d 3D | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 459.61 nm | データなし | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 461.05 nm | データなし | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 462.827 nm | データなし | Be III | emission | 1s.4d 3D → 1s.5p 3P* | 測定値 | NIST | |
| 463.774 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5p 3P* | 測定値 | NIST | |
| 463.774 nm | データなし | Be III | emission | 1s.4d 1D → 1s.5p 3P* | 測定値 | NIST | |
| 465.722198 nm | データなし | Be IV | emission | 5p 2P* → 6d 2D | 測定値 | NIST | |
| 465.730484 nm | データなし | Be IV | emission | 5s 2S → 6p 2P* | 測定値 | NIST | |
| 465.792545 nm | データなし | Be IV | emission | 5p 2P* → 6s 2S | 測定値 | NIST | |
| 465.805836 nm | データなし | Be IV | emission | 5s 2S → 6p 2P* | 測定値 | NIST | |
| 465.827127 nm | データなし | Be IV | emission | 5d 2D → 6f 2F* | 測定値 | NIST | |
| 465.827302 nm | データなし | Be IV | emission | 5p 2P* → 6d 2D | 測定値 | NIST | |
| 465.85207 nm | データなし | Be IV | emission | 5d 2D → 6p 2P* | 測定値 | NIST | |
| 465.852419 nm | データなし | Be IV | emission | 5p 2P* → 6d 2D | 測定値 | NIST | |
| 465.857919 nm | データなし | Be IV | emission | 5f 2F* → 6g 2G | 測定値 | NIST | |
| 465.857973 nm | データなし | Be IV | emission | 5d 2D → 6f 2F* | 測定値 | NIST | |
| 465.870408 nm | データなし | Be IV | emission | 5f 2F* → 6d 2D | 測定値 | NIST | |
| 465.870532 nm | データなし | Be IV | emission | 5d 2D → 6f 2F* | 測定値 | NIST | |
| 465.872059 nm | データなし | Be IV | emission | 5g 2G → 6h 2H* | 測定値 | NIST | |
| 465.872085 nm | データなし | Be IV | emission | 5f 2F* → 6g 2G | 測定値 | NIST | |
| 465.879556 nm | データなし | Be IV | emission | 5g 2G → 6f 2F* | 測定値 | NIST | |
| 465.879621 nm | データなし | Be IV | emission | 5f 2F* → 6g 2G | 測定値 | NIST | |
| 465.8800567 nm | データなし | Be IV | emission | 5g 2G → 6h 2H* | 測定値 | NIST | |
| 465.8850804 nm | データなし | Be IV | emission | 5g 2G → 6h 2H* | 測定値 | NIST | |
| 465.892111 nm | データなし | Be IV | emission | 5f 2F* → 6d 2D | 測定値 | NIST | |
| 465.892116 nm | データなし | Be IV | emission | 5g 2G → 6f 2F* | 測定値 | NIST | |
| 465.892578 nm | データなし | Be IV | emission | 5g 2G → 6f 2F* | 測定値 | NIST | |
| 465.89548 nm | データなし | Be IV | emission | 5d 2D → 6p 2P* | 測定値 | NIST | |
| 465.89553 nm | データなし | Be IV | emission | 5f 2F* → 6d 2D | 測定値 | NIST | |
| 465.9228055 nm | データなし | Be IV | emission | 5p 2P* → 6s 2S | 測定値 | NIST | |
| 465.927462 nm | データなし | Be IV | emission | 5d 2D → 6p 2P* | 測定値 | NIST | |
| 466.346 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 測定値 | NIST | |
| 466.346 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 測定値 | NIST | |
| 466.346 nm | データなし | Be III | emission | 1s.4p 3P* → 1s.5s 3S | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 466.37 nm | データなし | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | 測定値 | NIST | |
| 467.3332 nm | 1060 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 測定値 | NIST | |
| 467.342 nm | 1160 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 測定値 | NIST | |
| 467.345 nm | データなし | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | 測定値 | NIST | |
| 470.234 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 測定値 | NIST | |
| 470.252 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 測定値 | NIST | |
| 470.252 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | 測定値 | NIST | |
| 470.9391 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 測定値 | NIST | |
| 470.9394 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 測定値 | NIST | |
| 470.9396 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | 測定値 | NIST | |
| 480.759 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | 測定値 | NIST | |
| 480.777 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | 測定値 | NIST | |
| 482.799 nm | データなし | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 測定値 | NIST | |
| 482.812 nm | データなし | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 測定値 | NIST | |
| 482.818 nm | データなし | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | 測定値 | NIST | |
| 484.9153 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 測定値 | NIST | |
| 484.9153 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 測定値 | NIST | |
| 484.9156 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | 測定値 | NIST | |
| 485.233 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 測定値 | NIST | |
| 485.238 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 測定値 | NIST | |
| 485.238 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | 測定値 | NIST | |
| 485.6045 nm | データなし | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 測定値 | NIST | |
| 485.61897 nm | データなし | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 測定値 | NIST | |
| 485.61897 nm | データなし | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 測定値 | NIST | |
| 485.6741 nm | データなし | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 測定値 | NIST | |
| 485.6741 nm | データなし | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | 測定値 | NIST | |
| 485.82 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 485.823 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 485.823 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 508.7714 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 測定値 | NIST | |
| 508.7714 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 測定値 | NIST | |
| 508.7719 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | 測定値 | NIST | |
| 515.2 nm | データなし | Be III | emission | 1s.5d 1D → 1s.7p 1P* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 515.778 nm | データなし | Be III | emission | 1s.5d 3D → 1s.7f 3F* | 測定値 | NIST | |
| 516.51 nm | データなし | Be III | emission | 1s.5d 1D → 1s.7f 3F* | 測定値 | NIST | |
| 516.51 nm | データなし | Be III | emission | 1s.5d 1D → 1s.7f 3F* | 測定値 | NIST | |
| 521.8119 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 測定値 | NIST | |
| 521.834 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 測定値 | NIST | |
| 521.834 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | 測定値 | NIST | |
| 525.007 nm | データなし | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.9p 1P* | 測定値 | NIST | |
| 525.584 nm | データなし | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | 測定値 | NIST | |
| 525.59 nm | データなし | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | 測定値 | NIST | |
| 526.1527 nm | 5 | Be I | emission | 1s2.2s.5p 1P* → 1s2.2p.3p 1P | 測定値 | NIST | |
| 527.027 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | 測定値 | NIST | |
| 527.0806 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | 測定値 | NIST | |
| 536.552 nm | データなし | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.8p 1P* | 測定値 | NIST | |
| 540.299 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 測定値 | NIST | |
| 540.306 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 測定値 | NIST | |
| 540.306 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | 測定値 | NIST | |
| 541.018 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 測定値 | NIST | |
| 541.022 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 測定値 | NIST | |
| 541.022 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | 測定値 | NIST | |
| 541.612 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | 測定値 | NIST | |
| 541.636 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | 測定値 | NIST | |
| 544.069 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 測定値 | NIST | |
| 544.073 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 測定値 | NIST | |
| 544.076 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | 測定値 | NIST | |
| 554.648 nm | データなし | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.7p 1P* | 測定値 | NIST | |
| 555.881 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 測定値 | NIST | |
| 555.881 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 測定値 | NIST | |
| 555.881 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | 測定値 | NIST | |
| 585.7012 nm | 3 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.6p 1P* | 測定値 | NIST | |
| 593.771 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.9p 1P* | 測定値 | NIST | |
| 608.58 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 1P* | 測定値 | NIST | |
| 608.6 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 3P* | 測定値 | NIST | |
| 614.2 nm | データなし | Be III | emission | 1s.2s 1S → 1s.2p 1P* | 測定値 | NIST | |
| 622.9108 nm | 3 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7f 1F* | 測定値 | NIST | |
| 627.9418 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 測定値 | NIST | |
| 627.9737 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 測定値 | NIST | |
| 627.9737 nm | データなし | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | 測定値 | NIST | |
| 631.966 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 1P* | 測定値 | NIST | |
| 632.145 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 3P* | 測定値 | NIST | |
| 647.3536 nm | 7 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.5p 1P* | 測定値 | NIST | |
| 654.784 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 測定値 | NIST | |
| 654.793 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 測定値 | NIST | |
| 654.794 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | 測定値 | NIST | |
| 655.833 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 測定値 | NIST | |
| 655.839 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 測定値 | NIST | |
| 655.839 nm | データなし | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | 測定値 | NIST | |
| 656.4519 nm | 9 | Be I | emission | 1s2.2p2 1D → 1s2.2s.6f 1F* | 測定値 | NIST | |
| 663.633 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 測定値 | NIST | |
| 663.644 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 測定値 | NIST | |
| 663.644 nm | データなし | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | 測定値 | NIST | |
| 671.15 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 671.21 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 671.23 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 671.25 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 671.25 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 671.26 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | 測定値 | NIST | |
| 672.598 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.6p 1P* | 測定値 | NIST | |
| 675.675 nm | 10 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | 測定値 | NIST | |
| 675.712 nm | 110 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | 測定値 | NIST | |
| 678.656 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 測定値 | NIST | |
| 678.656 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 測定値 | NIST | |
| 678.656 nm | データなし | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | 測定値 | NIST | |
| 688.422 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 688.422 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 688.423 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 688.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 688.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 688.444 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | 測定値 | NIST | |
| 698.273 nm | 13 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2p2 1D | 測定値 | NIST | |
| 704.98 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 測定値 | NIST | |
| 704.98 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 測定値 | NIST | |
| 705 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | 測定値 | NIST | |
| 715.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 715.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 715.441 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 715.459 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 715.46 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 715.465 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | 測定値 | NIST | |
| 720.9132 nm | 13 | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 1F* | 測定値 | NIST | |
| 720.928 nm | データなし | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 3F* | 測定値 | NIST | |
| 730.819 nm | データなし | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9d 1D | 測定値 | NIST | |
| 740.1196 nm | 210 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | 測定値 | NIST | |
| 740.1431 nm | 110 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | 測定値 | NIST | |
| 743.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 測定値 | NIST | |
| 743.44 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 測定値 | NIST | |
| 743.46 nm | データなし | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | 測定値 | NIST | |
| 744.887 nm | データなし | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9s 1S | 測定値 | NIST | |
| 749.842 nm | データなし | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.8d 1D | 測定値 | NIST |
詳細な性質
共有結合半径（詳細）
- 共有結合半径（Pyykkö）
- 102 pm
- 共有結合半径（Pyykkö、二重結合）
- 90 pm
- 共有結合半径（Pyykkö、三重結合）
- 85 pm
- 共有結合半径（Bragg）
- 115 pm
ファンデルワールス半径
- Truhlar
- 153 pm
- Batsanov
- 190 pm
- Alvarez
- 198 pm
- UFF
- 274.5 pm
- MM3
- 223 pm
原子半径と金属半径
- 原子半径（Rahm）
- 219 pm
- 金属半径（C12）
- 112 pm
番号付けの尺度
- Mendeleev
- 75
- Pettifor
- 77
- Glawe
- 77
電気陰性度の尺度
- Ghosh
- 0
- Miedema
- 5
- Gunnarsson–Lundqvist
- 4
- Robles–Bartolotti
- 4
分極率と分散
- 双極子分極率
- 37.74 a.u.
- 双極子分極率（不確かさ）
- 0.03 a.u.
- C₆
- 227 Ha·Bohr6
- C₆ (Gould–Bučko)
- 214 Ha·Bohr6
ミーデマパラメータ
- ミーデマモル体積
- 4.9 cm3/mol
- ミーデマ電子密度
- 5
供給リスクと経済性
- 生産集中度
- 85
- 相対供給リスク
- 8
- 政治的安定性（最大生産国）
- 57
相転移と同素体
| 融点 | 1560.15 K |
| 沸点 | 2741.15 K |
| 臨界点（温度） | 5205.15 K |
酸化数の分類
専門参考データ
遮蔽定数 (2)
| n | 軌道 | σ |
|---|---|---|
| 1 | s | 0.3152 |
| 2 | s | 2.088 |
結晶半径の詳細 (3)
| 電荷 | CN | スピン | rcrystal (pm) | 由来 |
|---|---|---|---|---|
| 2 | III | 30 | ||
| 2 | IV | 41 | ||
| 2 | VI | 59 | calculated, |
同位体の崩壊形式 (19)
| 同位体 | モード | 強度 |
|---|---|---|
| 5 | p | — |
| 6 | 2p | 100% |
| 7 | EC | 100% |
| 8 | A | 100% |
| 10 | B- | 100% |
| 11 | B- | 100% |
| 11 | B-A | 3.3% |
| 11 | B-p | 0% |
| 11 | B-n | — |
| 12 | B- | 100% |
X線散乱因子 (724)
| エネルギー (eV) | f₁ | f₂ |
|---|---|---|
| 10 | — | 1.70333 |
| 10.1617 | — | 1.71802 |
| 10.3261 | — | 1.73284 |
| 10.4931 | — | 1.74778 |
| 10.6628 | — | 1.75737 |
| 10.8353 | — | 1.76678 |
| 11.0105 | — | 1.77624 |
| 11.1886 | — | 1.78574 |
| 11.3696 | — | 1.7953 |
| 11.5535 | — | 1.80306 |
追加データ
Estimated Crustal Abundance
The estimated element abundance in the earth's crust.
2.8 milligrams per kilogram
参考文献 (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Estimated Oceanic Abundance
The estimated element abundance in the earth's oceans.
5.6×10-6 milligrams per liter
参考文献 (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Sources
Sources of this element.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
参考文献 (1)
- [6] Beryllium https://periodic.lanl.gov/4.shtml
参考文献
(9)
Data deposited in or computed by PubChem
The half-life and atomic mass data was provided by the Atomic Mass Data Center at the International Atomic Energy Agency.
Element data are cited from the Atomic weights of the elements (an IUPAC Technical Report). The IUPAC periodic table of elements can be found at https://iupac.org/what-we-do/periodic-table-of-elements/. Additional information can be found within IUPAC publication doi:10.1515/pac-2015-0703 Copyright © 2020 International Union of Pure and Applied Chemistry.
The information are cited from Pure Appl. Chem. 2018; 90(12): 1833-2092, https://doi.org/10.1515/pac-2015-0703.
Thomas Jefferson National Accelerator Facility (Jefferson Lab) is one of 17 national laboratories funded by the U.S. Department of Energy. The lab's primary mission is to conduct basic research of the atom's nucleus using the lab's unique particle accelerator, known as the Continuous Electron Beam Accelerator Facility (CEBAF). For more information visit https://www.jlab.org/
The periodic table at the LANL (Los Alamos National Laboratory) contains basic element information together with the history, source, properties, use, handling and more. The provenance data may be found from the link under the source name.
The periodic table contains NIST's critically-evaluated data on atomic properties of the elements. The provenance data that include data for atomic spectroscopy, X-ray and gamma ray, radiation dosimetry, nuclear physics, and condensed matter physics may be found from the link under the source name. Ref: https://www.nist.gov/pml/atomic-spectra-database
This section provides all form of data related to element Beryllium.
The element property data was retrieved from publications.