Beryllium (Be)
alkaline-earth-metalSolid
Peso atômico padrão
9,012183 uConfiguração eletrônica
[He] 2s2Ponto de fusão
1286,85 °CPonto de ebulição
2470,85 °CDensidade
1850 kg/m³Estados de oxidação
0, +1, +2Eletronegatividade (Pauling)
1,57Energia de ionização (1ª)
9,322699 eVAno da descoberta
1797Raio atômico
105 pmDetalhes
Beryllium is a light alkaline earth metal with unusually high stiffness, low density, and a high melting point for its mass. Its chemistry is dominated by the +2 oxidation state, but the small Be²⁺ ion gives many compounds pronounced covalent character. The element is rare in accessible ores, chiefly obtained from beryl and bertrandite, and is technologically important where low mass, dimensional stability, and transparency to X-rays are valuable.
The metal, steel gray in color, has many desirable properties. As one of the lightest of all metals, it has one of the highest melting points of the light metals. Its modulus of elasticity is about one third greater than that of steel. It resists attack by concentrated nitric acid, has excellent thermal conductivity, and is nonmagnetic. It has a high permeability to X-rays and when bombarded by alpha particles, as from radium or polonium, neutrons are produced in the amount of about 30 neutrons/million alpha particles.
At ordinary temperatures, beryllium resists oxidation in air, although its ability to scratch glass is probably due to the formation of a thin layer of the oxide.
The name derives from the Greek word beryllos for "beryl", a gemstone in which it is found (3BeO×Al2O3×6SiO2).
Beryllium was discovered by the French chemist and pharmacist Nicholas-Louis Vauquelin in beryl and emerald in 1797. The element was first separated in 1828 by the French chemist Antoine-Alexandre-Brutus Bussy and independently by the German chemist Friedrich Wöhler. Because the salts of beryllium have a sweet taste, the element was also known as glucinium from the Greek glykys for "sweet", until IUPAC selected the name beryllium in 1949.
Although emeralds and beryl were known to ancient civilizations, they were first recognized as the same mineral (Be3Al2(SiO3)6) by Abbé Haüy in 1798. Later that year, Louis-Nicholas Vauquelin, a French chemist, discovered that an unknown element was present in emeralds and beryl. Attempts to isolate the new element finally succeeded in 1828 when two chemists, Friedrich Wölhler of Germany and A. Bussy of France, independently produced beryllium by reducing beryllium chloride (BeCl2) with potassium in a platinum crucible. Today, beryllium is primarily obtained from the minerals beryl (Be3Al2(SiO3)6) and bertrandite (4BeO·2SiO2·H2O) through a chemical process or through the electrolysis of a mixture of molten beryllium chloride (BeCl2) and sodium chloride (NaCl).
From the Greek word beryllos, beryl; also called glucinium or glucinum, Greek glykys, sweet. Discovered in the oxide form by Vauquelin in both beryl and emeralds in 1798. The metal was isolated in 1828 by Wohler and by Bussy independently by the action of potassium on beryllium chloride.
Pure beryllium is a hard, brittle, steel-gray metal with a metallic luster. It is solid at ordinary conditions and forms a thin, adherent oxide film that helps resist further oxidation in dry air. Powdered or freshly machined material is more reactive and presents greater handling risk.
Beryllium metal is used in specialized aerospace, defense, satellite, and scientific instruments where stiffness, low density, and thermal stability justify its cost and handling controls. Thin beryllium windows transmit X-rays and are used in X-ray tubes and detectors. Copper-beryllium alloys are important for springs, electrical contacts, non-sparking tools, and fatigue-resistant precision parts. Beryllium oxide ceramics are used as electrically insulating but thermally conductive materials in some electronic and microwave components.
Beryllium is relatively transparent to X-rays and is used to make windows for X-ray tubes. When exposed to alpha particles, such as those emitted by radium or polonium, beryllium emits neutrons and is used as a neutron source. Beryllium is also used as a moderator in nuclear reactors.
Beryllium is alloyed with copper (2% beryllium, 98% copper) to form a wear resistant material, known as beryllium bronze, used in gyroscopes and other devices where wear resistance is important. Beryllium is alloyed with nickel (2% beryllium, 98% nickel) to make springs, spot-welding electrodes and non-sparking tools. Other beryllium alloys are used in the windshield, brake disks and other structural components of the space shuttle.
Beryllium oxide (BeO), a compound of beryllium, is used in the nuclear industry and in ceramics.
Beryllium was once known as glucinum, which means sweet, since beryllium and many of its compounds have a sugary taste. Unfortunately for the chemists that discovered this particular property, beryllium and many of its compounds are poisonous and should never be tasted or ingested.
Beryllium is used as an alloying agent in producing beryllium copper, which is extensively used for springs, electrical contacts, spot-welding electrodes, and non-sparking tools. It is applied as a structural material for high-speed aircraft, missiles, spacecraft, and communication satellites. Other uses include windshield frame, brake discs, support beams, and other structural components of the space shuttle.
Because beryllium is relatively transparent to X-rays, ultra-thin Be-foil is finding use in X-ray lithography for reproduction of micro-miniature integrated circuits.
Beryllium is used in nuclear reactors as a reflector or moderator for it has a low thermal neutron absorption cross section.
It is used in gyroscopes, computer parts, and instruments where lightness, stiffness, and dimensional stability are required. The oxide has a very high melting point and is also used in nuclear work and ceramic applications.
Isotopes in Geochronology
Cosmogenic 10Be and 7Be isotopes are produced in the atmosphere, largely by cosmic-ray spallation of nitrogen and oxygen. Because of its relatively short half-life (7Be, half-life t1/2=53 d, compared to that of 10Be, half-life t1/2=1.39×106 a, where the unit symbol “d” stands for day and “a” stands for year), measurements of cosmogenic 7Be, and especially the isotope-amount ratio n(7Be)/n(10Be), have been used to study rates of atmospheric circulation, mixing, formation of aerosols (fine solids or liquids suspended in a gas; e.g. smoke and mist are aerosols), and particle deposition [44] C. E. Jordan, J. E. Dibb, R. C. Finkel. J. Geophys. Res. Atmos.108, (2003).. Cosmogenic atmospheric beryllium isotopes (7Be and 10Be) are deposited on the Earth’s surface, where they accumulate in soils, sediments, and snow while decaying away. Measurements of cosmogenic beryllium isotopes in such deposits are used to explore rates of soil formation, erosion, sedimentation, and snow accumulation on time scales ranging from months (7Be) to millions of years (10Be) [45] J. M. Kaste, S. A. Norton, C. T. Hess. Rev. Mineral. Geochem.50, 271 (2002)., [46] J. A. Graly, P. R. Bierman, L. J. Reusser, M. J. Pavich. Geochim. Cosmochim. Acta.74, 6814 (2010).. The minerals in rocks at the Earth’s surface interact with cosmic rays and form substantial quantities of 10Be and 7Be, thus providing a tool to determine the ages of geologic processes. In some situations, it is possible to estimate “exposure ages” for rocks in eroding terrains [47] P. R. Bierman, M. W. Caffee, P. T. Davis, K. Marsella, M. Pavich, P. Colgan, D. Mickelson, J. Larsen. Rev. Mineral. Geochem.50, 147 (2002)., [48] P. Bierman, E. A. Zen, M. Pavich, L. Reusser. U.S. Geol. Surv. Circ.1264, 191 (2004)., [49] L. Reusser, P. Bierman, M. Pavich, J. Larsen, R. Finkel. Am. J. Sci.306, 69 (2006).. By comparing measured 10Be concentrations with estimated rates of in situ cosmogenic 10Be production, the rate of rock erosion and formation of canyons and other geologic features can be determined (Fig. IUPAC.4.1).
Anthropogenic 10Be was produced by nuclear bomb explosions largely through the reaction of fast neutrons (neutrons produced by nuclear fission having high kinetic energy) with 13C via the 13C (n, alpha) 10Be reaction in atmospheric CO2. Although the quantity of 10Be produced in this way is small, its presence above natural background concentrations in some environmental samples can potentially provide information about bomb-related processes and contamination [50] N. E. Whitehead, S. Endo, K. Tanaka, T. Takatsuji, M. Hoshi, S. Fukutani, R. G. Ditchburn, A. Zondervan. J. Environ. Radioact.99, 260 (2008)..
Beryllium most commonly forms Be²⁺ compounds, although their bonding is often strongly polarizing and partly covalent. Beryllium oxide (BeO) is a refractory ceramic with high thermal conductivity and electrical insulation. Beryllium hydroxide (Be(OH)₂) is amphoteric, dissolving in both acids and strong bases. Beryllium chloride (BeCl₂) is polymeric in the solid state and hydrolyzes readily. Natural beryllium occurs mainly in silicate minerals, especially beryl, with ideal formula Be₃Al₂Si₆O₁₈, and in bertrandite, Be₄Si₂O₇(OH)₂.
See more information at the Beryllium compound page.
Beryllium metal, dusts, fumes, and soluble compounds are highly toxic by inhalation. Occupational exposure can cause sensitization and chronic beryllium disease, a serious immune-mediated lung disorder. Machining, grinding, and high-temperature processing require strict dust and fume control. Solid finished articles are less hazardous if they are not abraded, heated, or otherwise made into respirable material.
Beryllium and its salts are toxic and should be handled with the greatest of care. Beryllium and its compounds should not be tasted to verify the sweetish nature of beryllium (as did early experimenters). The metal, its alloys, and its salts can be handled if certain work codes are observed, but no attempt should be made to work with beryllium before becoming familiar with proper safeguards.
Beryllium is a minor constituent of the continental crust and is concentrated by geological processes into uncommon silicate minerals. It has no known essential biological role. In soils and waters its mobility depends strongly on pH, mineral surfaces, and complexation; it is generally not abundant in natural waters. Environmental releases are mainly associated with mining, ore processing, combustion of some coals, and industrial handling of beryllium-containing materials.
Commercial beryllium supply is limited by the scarcity of workable deposits and by the need for controlled processing because of toxicity. Bertrandite ores in the United States and beryl from several regions have been important feedstocks. Extraction is chemically complex, and much demand is for high-value metal, copper-beryllium master alloys, and beryllium oxide ceramics rather than bulk structural metal. Recycling occurs from manufacturing scrap and selected end-of-life alloys, but health controls and material traceability are significant constraints. Substitution is often possible only with loss of stiffness, conductivity, X-ray transparency, or fatigue performance.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
Beryllium is cosmically scarce because stable nuclei with mass numbers 5 and 8 are absent, limiting its production in ordinary stellar fusion chains. Most natural beryllium is thought to form by cosmic-ray spallation of heavier nuclei such as carbon, nitrogen, and oxygen in interstellar material. It is present in the Solar System only at low abundance compared with neighboring light elements.
- Beryllium has only one stable isotope, ⁹Be.
- Emerald and aquamarine are gem varieties of beryl colored by trace impurities, not by beryllium itself.
- Beryllium windows can pass X-rays while blocking visible light and air.
- Copper-beryllium tools are valued where sparking must be minimized.
- Beryllium oxide combines ceramic insulation with unusually high heat conduction.
Imagens
Propriedades
Física
- Raio atômico (empírico)
- 105 pm Comparar Raio atômico (empírico) de todos os elementos →
- Raio covalente
- 96 pm Comparar Raio covalente de todos os elementos →
- Raio de van der Waals
- 153 pm Comparar Raio de van der Waals de todos os elementos →
- Raio metálico
- 89 pm Comparar Raio metálico de todos os elementos →
- Densidade
- 1850 kg/m³ Comparar Densidade de todos os elementos →
- Volume molar
- 0,005 L/mol
- Fase nas CNTP
- Sólido Comparar Fase nas CNTP de todos os elementos →
- Ponto de fusão
- 1286,85 °C Comparar Ponto de fusão de todos os elementos →
- Ponto de ebulição
- 2470,85 °C Comparar Ponto de ebulição de todos os elementos →
- Condutividade térmica
- 201 W/(m·K) Comparar Condutividade térmica de todos os elementos →
- Capacidade calorífica específica
- 1,825 J/(g·K) Comparar Capacidade calorífica específica de todos os elementos →
- Capacidade calorífica molar
- 16,443 J/(mol·K) Comparar Capacidade calorífica molar de todos os elementos →
- Estrutura cristalina
- Hexagonal compacta Comparar Estrutura cristalina de todos os elementos →
Química
- Eletronegatividade (Pauling)
- 1,57 Comparar Eletronegatividade (Pauling) de todos os elementos →
- Eletronegatividade (Allen)
- 1,576
- Afinidade eletrônica
- -0,52 eV (valor negativo — prevê-se que o átomo não capte um eletrão adicional)
- Energia de ionização (1ª)
- 9,322699 eV Comparar Energia de ionização (1ª) de todos os elementos →
- Energia de ionização (2ª)
- 18,211213 eV Comparar Energia de ionização (2ª) de todos os elementos →
- Energia de ionização (3ª)
- 153,896735 eV Comparar Energia de ionização (3ª) de todos os elementos →
- Energia de ionização (4ª)
- 217,719334 eV Comparar Energia de ionização (4ª) de todos os elementos →
- Estados de oxidação
- 0, +1, +2 Comparar Estados de oxidação de todos os elementos →
- Elétrons de valência
- 2 Comparar Elétrons de valência de todos os elementos →
- Configuração eletrônica
- [He] 2s2
Termodinâmica
- Ponto crítico (temperatura)
- 4932 °C
- Calor de fusão
- 0,12644453 eV Comparar Calor de fusão de todos os elementos →
- Calor de vaporização
- 3,078199 eV Comparar Calor de vaporização de todos os elementos →
- Calor de sublimação
- 3,358035 eV
- Calor de atomização
- 3,358035 eV
- Entalpia de atomização
- 3,358035 eV
Nuclear
- Prótons
- 4 Comparar Prótons de todos os elementos →
- Nêutrons
- 5 Comparar Nêutrons de todos os elementos →
- Isótopos conhecidos
- 12 Comparar Isótopos conhecidos de todos os elementos →
- Isótopos estáveis
- 1 Comparar Isótopos estáveis de todos os elementos →
- Isótopo mais estável
- Be-9
- Ano da descoberta
- 1797
Abundância
- Abundância (crosta terrestre)
- 2,8 mg/kg Comparar Abundância (crosta terrestre) de todos os elementos →
- Abundância (oceano)
- 5,6 × 10−6 mg/L Comparar Abundância (oceano) de todos os elementos →
Estrutura cristalina
- Constante de rede a
- 229 pm
Estrutura eletrônica
- Elétrons por camada
- 2, 2 Comparar Elétrons por camada de todos os elementos →
Identificadores
- Número CAS
- 7440-41-7 Comparar Número CAS de todos os elementos →
- Símbolo de termo
- 1S0
- InChI
- InChI=1S/Be
- Chave InChI
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N
Configuração eletrônica Medido
Be: 2s²[He] 2s²1s² 2s²Modelo atômico
Os isótopos alteram o número de nêutrons, a massa e a estabilidade — não a configuração eletrônica de um átomo neutro.
Modelo atômico esquemático, sem escala.
Assinatura atômica
Espectro de emissão / absorção
Distribuição isotópica
| Número de massa | Massa atômica (u) | Abundância natural | Meia-vida |
|---|---|---|---|
| 9 Estável | 9,012183065 ± 0,000000082 | 100,0000% | Estável |
Fase / Estado
Motivo: 1261,8 °C abaixo do ponto de fusão (1286,85 °C)
Esquemático, sem escala
Pontos de transição de fase
Energias de transição
Energia necessária para fundir 1 mol no ponto de fusão
Energia necessária para vaporizar 1 mol no ponto de ebulição
Energia necessária para sublimar 1 mol no ponto de sublimação
Densidade
Em condições padrão
Em condições padrão
Avançado
Espectros atômicos
Dados de linhas disponíveis ?
| Íon | Carga | Total de linhas | Probabilidades de transição | Designações dos níveis |
|---|---|---|---|---|
| Be I | 0 | 581 | 394 | 581 |
| Be II | +1 | 681 | 149 | 681 |
| Be III | +2 | 323 | 302 | 316 |
| Be IV | +3 | 142 | 142 | 142 |
Dados de níveis disponíveis ?
| Íon | Carga | Níveis |
|---|---|---|
| Be I | 0 | 219 |
| Be II | +1 | 258 |
| Be III | +2 | 167 |
| Be IV | +3 | 149 |
Raios iônicos
| Carga | Coordenação | Spin | Raio |
|---|---|---|---|
| +2 | 3 | N/D | 16 pm |
| +2 | 4 | N/D | 27 pm |
| +2 | 6 | N/D | 45 pm |
Compostos
Isótopos (1)
| Número de massa | Massa atômica (u) | Abundância natural | Meia-vida | Modo de decaimento | |
|---|---|---|---|---|---|
| 9 Estável | 9,012183065 ± 0,000000082 | 100,0000% | Estável | stable |
Linhas espectrais
| Comprimento de onda (nm) | Intensidade | Estágio de ionização | Tipo | Transição | Exatidão | Fonte | |
|---|---|---|---|---|---|---|---|
| 381.3453 nm | 22 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4d 1D | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 385.17 nm | N/D | Be II | emission | 1s.2p.3p 4D → 1s.2p.4s 4P* | Medida | NIST | |
| 386.513 nm | 3 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 386.5427 nm | 5 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 386.5517 nm | 1 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 386.5725 nm | 2 | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 386.6022 nm | N/D | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 386.6037 nm | N/D | Be I | emission | 1s2.2p2 3P → 1s2.2p.3s 3P* | Medida | NIST | |
| 388.143 nm | N/D | Be III | emission | 1s.4s 3S → 1s.5p 3P* | Medida | NIST | |
| 388.143 nm | N/D | Be III | emission | 1s.4s 3S → 1s.5p 3P* | Medida | NIST | |
| 388.143 nm | N/D | Be III | emission | 1s.4s 3S → 1s.5p 3P* | Medida | NIST | |
| 399.55 nm | N/D | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | Medida | NIST | |
| 399.55 nm | N/D | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | Medida | NIST | |
| 399.55 nm | N/D | Be II | emission | 1s.2p.(3P*).3d 2D* → 1s.2p.(3P*).4f 2F | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 403.93 nm | N/D | Be II | emission | 1s.2p.3d 4F* → 1s.2p.4f 4D | Medida | NIST | |
| 416.63 nm | N/D | Be III | emission | 1s.4s 1S → 1s.5p 1P* | Medida | NIST | |
| 419.97 nm | N/D | Be III | emission | 1s.4s 1S → 1s.5d 1D | Medida | NIST | |
| 424.41 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 1D | Medida | NIST | |
| 424.41 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 1D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 424.906 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5d 3D | Medida | NIST | |
| 425.2 nm | N/D | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | Medida | NIST | |
| 425.2 nm | N/D | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | Medida | NIST | |
| 425.2 nm | N/D | Be II | emission | 1s.2s.3p 4P* → 1s.2s.4s 4S | Medida | NIST | |
| 425.2987 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 425.2987 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 425.2987 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 425.3707 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 425.3707 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 425.4085 nm | N/D | Be I | emission | 1s2.2s.3d 3D → 1s2.2p.3s 3P* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 432.953 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4f 4F* | Medida | NIST | |
| 433.302 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | Medida | NIST | |
| 433.306 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | Medida | NIST | |
| 433.306 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.10f 2F* | Medida | NIST | |
| 436.0665 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | Medida | NIST | |
| 436.0986 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | Medida | NIST | |
| 436.1032 nm | N/D | Be II | emission | 1s2.3p 2P* → 1s2.4d 2D | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 437.112 nm | N/D | Be II | emission | 1s.2p.3d 4D* → 1s.2p.4f 4F | Medida | NIST | |
| 440.393 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | Medida | NIST | |
| 440.408 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | Medida | NIST | |
| 440.408 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.9d 2D | Medida | NIST | |
| 440.7936 nm | 19 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.4s 1S | Medida | NIST | |
| 445.828 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5p 1P* | Medida | NIST | |
| 446.786 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | Medida | NIST | |
| 446.802 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.9s 2S | Medida | NIST | |
| 447.669 nm | N/D | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | Medida | NIST | |
| 447.672 nm | N/D | Be II | emission | 1s2.4s 2S → 1s2.7p 2P* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 1F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 1F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 448.651 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5f 3F* | Medida | NIST | |
| 449.54 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5f 1F* | Medida | NIST | |
| 449.54 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5f 3F* | Medida | NIST | |
| 449.54 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5f 3F* | Medida | NIST | |
| 449.96 nm | N/D | Be III | emission | 1s.4f 1F* → 1s.5d 1D | Medida | NIST | |
| 449.96 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 1D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 1F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 1F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 450.511 nm | N/D | Be III | emission | 1s.4f 3F* → 1s.5d 3D | Medida | NIST | |
| 452.6406 nm | 7 | Be I | emission | 1s2.2s.4p 1P* → 1s2.2p.3p 1P | Medida | NIST | |
| 453.543 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | Medida | NIST | |
| 453.548 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | Medida | NIST | |
| 453.548 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9f 2F* | Medida | NIST | |
| 453.58 nm | N/D | Be III | emission | 1s.4p 1P* → 1s.5p 1P* | Medida | NIST | |
| 454.06 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | Medida | NIST | |
| 454.062 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | Medida | NIST | |
| 454.062 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.9g 2G | Medida | NIST | |
| 454.788 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | Medida | NIST | |
| 454.789 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | Medida | NIST | |
| 454.793 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.9p 2P* | Medida | NIST | |
| 454.8055 nm | N/D | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | Medida | NIST | |
| 454.85379 nm | N/D | Be I | emission | 1s2.2s2 1S → 1s2.2s.2p 3P* | Medida | NIST | |
| 457.266603 nm | 30 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2s.3d 1D | Medida | NIST | |
| 457.55 nm | N/D | Be III | emission | 1s.4p 1P* → 1s.5d 1D | Medida | NIST | |
| 458.12 nm | N/D | Be III | emission | 1s.4p 1P* → 1s.5d 3D | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 459.61 nm | N/D | Be II | emission | 1s.2s.3d 4D → 1s.2s.4p 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 461.05 nm | N/D | Be II | emission | 1s.2p.3p 4P → 1s.2p.4s 4P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 462.827 nm | N/D | Be III | emission | 1s.4d 3D → 1s.5p 3P* | Medida | NIST | |
| 463.774 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5p 3P* | Medida | NIST | |
| 463.774 nm | N/D | Be III | emission | 1s.4d 1D → 1s.5p 3P* | Medida | NIST | |
| 465.722198 nm | N/D | Be IV | emission | 5p 2P* → 6d 2D | Medida | NIST | |
| 465.730484 nm | N/D | Be IV | emission | 5s 2S → 6p 2P* | Medida | NIST | |
| 465.792545 nm | N/D | Be IV | emission | 5p 2P* → 6s 2S | Medida | NIST | |
| 465.805836 nm | N/D | Be IV | emission | 5s 2S → 6p 2P* | Medida | NIST | |
| 465.827127 nm | N/D | Be IV | emission | 5d 2D → 6f 2F* | Medida | NIST | |
| 465.827302 nm | N/D | Be IV | emission | 5p 2P* → 6d 2D | Medida | NIST | |
| 465.85207 nm | N/D | Be IV | emission | 5d 2D → 6p 2P* | Medida | NIST | |
| 465.852419 nm | N/D | Be IV | emission | 5p 2P* → 6d 2D | Medida | NIST | |
| 465.857919 nm | N/D | Be IV | emission | 5f 2F* → 6g 2G | Medida | NIST | |
| 465.857973 nm | N/D | Be IV | emission | 5d 2D → 6f 2F* | Medida | NIST | |
| 465.870408 nm | N/D | Be IV | emission | 5f 2F* → 6d 2D | Medida | NIST | |
| 465.870532 nm | N/D | Be IV | emission | 5d 2D → 6f 2F* | Medida | NIST | |
| 465.872059 nm | N/D | Be IV | emission | 5g 2G → 6h 2H* | Medida | NIST | |
| 465.872085 nm | N/D | Be IV | emission | 5f 2F* → 6g 2G | Medida | NIST | |
| 465.879556 nm | N/D | Be IV | emission | 5g 2G → 6f 2F* | Medida | NIST | |
| 465.879621 nm | N/D | Be IV | emission | 5f 2F* → 6g 2G | Medida | NIST | |
| 465.8800567 nm | N/D | Be IV | emission | 5g 2G → 6h 2H* | Medida | NIST | |
| 465.8850804 nm | N/D | Be IV | emission | 5g 2G → 6h 2H* | Medida | NIST | |
| 465.892111 nm | N/D | Be IV | emission | 5f 2F* → 6d 2D | Medida | NIST | |
| 465.892116 nm | N/D | Be IV | emission | 5g 2G → 6f 2F* | Medida | NIST | |
| 465.892578 nm | N/D | Be IV | emission | 5g 2G → 6f 2F* | Medida | NIST | |
| 465.89548 nm | N/D | Be IV | emission | 5d 2D → 6p 2P* | Medida | NIST | |
| 465.89553 nm | N/D | Be IV | emission | 5f 2F* → 6d 2D | Medida | NIST | |
| 465.9228055 nm | N/D | Be IV | emission | 5p 2P* → 6s 2S | Medida | NIST | |
| 465.927462 nm | N/D | Be IV | emission | 5d 2D → 6p 2P* | Medida | NIST | |
| 466.346 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5s 3S | Medida | NIST | |
| 466.346 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5s 3S | Medida | NIST | |
| 466.346 nm | N/D | Be III | emission | 1s.4p 3P* → 1s.5s 3S | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 466.37 nm | N/D | Be II | emission | 1s.2p.3d 4P* → 1s.2p.4f 4D | Medida | NIST | |
| 467.3332 nm | 1060 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | Medida | NIST | |
| 467.342 nm | 1160 | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | Medida | NIST | |
| 467.345 nm | N/D | Be II | emission | 1s2.3d 2D → 1s2.4f 2F* | Medida | NIST | |
| 470.234 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | Medida | NIST | |
| 470.252 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | Medida | NIST | |
| 470.252 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.8d 2D | Medida | NIST | |
| 470.9391 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | Medida | NIST | |
| 470.9394 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | Medida | NIST | |
| 470.9396 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.8p 3P* | Medida | NIST | |
| 480.759 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | Medida | NIST | |
| 480.777 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.8s 2S | Medida | NIST | |
| 482.799 nm | N/D | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | Medida | NIST | |
| 482.812 nm | N/D | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | Medida | NIST | |
| 482.818 nm | N/D | Be II | emission | 1s2.3d 2D → 1s2.4p 2P* | Medida | NIST | |
| 484.9153 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | Medida | NIST | |
| 484.9153 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | Medida | NIST | |
| 484.9156 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.7p 3P* | Medida | NIST | |
| 485.233 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | Medida | NIST | |
| 485.238 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | Medida | NIST | |
| 485.238 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.8f 2F* | Medida | NIST | |
| 485.6045 nm | N/D | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | Medida | NIST | |
| 485.61897 nm | N/D | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | Medida | NIST | |
| 485.61897 nm | N/D | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | Medida | NIST | |
| 485.6741 nm | N/D | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | Medida | NIST | |
| 485.6741 nm | N/D | Be I | emission | 1s2.2s.2p 3P* → 1s2.2s.2p 1P* | Medida | NIST | |
| 485.82 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | Medida | NIST | |
| 485.823 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | Medida | NIST | |
| 485.823 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.8g 2G | Medida | NIST | |
| 508.7714 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | Medida | NIST | |
| 508.7714 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | Medida | NIST | |
| 508.7719 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.6p 3P* | Medida | NIST | |
| 515.2 nm | N/D | Be III | emission | 1s.5d 1D → 1s.7p 1P* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 515.778 nm | N/D | Be III | emission | 1s.5d 3D → 1s.7f 3F* | Medida | NIST | |
| 516.51 nm | N/D | Be III | emission | 1s.5d 1D → 1s.7f 3F* | Medida | NIST | |
| 516.51 nm | N/D | Be III | emission | 1s.5d 1D → 1s.7f 3F* | Medida | NIST | |
| 521.8119 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | Medida | NIST | |
| 521.834 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | Medida | NIST | |
| 521.834 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.7d 2D | Medida | NIST | |
| 525.007 nm | N/D | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.9p 1P* | Medida | NIST | |
| 525.584 nm | N/D | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | Medida | NIST | |
| 525.59 nm | N/D | Be II | emission | 1s2.4s 2S → 1s2.6p 2P* | Medida | NIST | |
| 526.1527 nm | 5 | Be I | emission | 1s2.2s.5p 1P* → 1s2.2p.3p 1P | Medida | NIST | |
| 527.027 nm | 810 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | Medida | NIST | |
| 527.0806 nm | 960 | Be II | emission | 1s2.3p 2P* → 1s2.4s 2S | Medida | NIST | |
| 536.552 nm | N/D | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.8p 1P* | Medida | NIST | |
| 540.299 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | Medida | NIST | |
| 540.306 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | Medida | NIST | |
| 540.306 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7f 2F* | Medida | NIST | |
| 541.018 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | Medida | NIST | |
| 541.022 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | Medida | NIST | |
| 541.022 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.7g 2G | Medida | NIST | |
| 541.612 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | Medida | NIST | |
| 541.636 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.7s 2S | Medida | NIST | |
| 544.069 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | Medida | NIST | |
| 544.073 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | Medida | NIST | |
| 544.076 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.7p 2P* | Medida | NIST | |
| 554.648 nm | N/D | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.7p 1P* | Medida | NIST | |
| 555.881 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | Medida | NIST | |
| 555.881 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | Medida | NIST | |
| 555.881 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.5p 3P* | Medida | NIST | |
| 585.7012 nm | 3 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.6p 1P* | Medida | NIST | |
| 593.771 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.9p 1P* | Medida | NIST | |
| 608.58 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 1P* | Medida | NIST | |
| 608.6 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.8p 3P* | Medida | NIST | |
| 614.2 nm | N/D | Be III | emission | 1s.2s 1S → 1s.2p 1P* | Medida | NIST | |
| 622.9108 nm | 3 | Be I | emission | 1s2.2p2 1D → 1s2.2s.7f 1F* | Medida | NIST | |
| 627.9418 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | Medida | NIST | |
| 627.9737 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | Medida | NIST | |
| 627.9737 nm | N/D | Be II | emission | 1s2.4p 2P* → 1s2.6d 2D | Medida | NIST | |
| 631.966 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 1P* | Medida | NIST | |
| 632.145 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.7p 3P* | Medida | NIST | |
| 647.3536 nm | 7 | Be I | emission | 1s2.2s.3s 1S → 1s2.2s.5p 1P* | Medida | NIST | |
| 654.784 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | Medida | NIST | |
| 654.793 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | Medida | NIST | |
| 654.794 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6f 2F* | Medida | NIST | |
| 655.833 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | Medida | NIST | |
| 655.839 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | Medida | NIST | |
| 655.839 nm | N/D | Be II | emission | 1s2.4f 2F* → 1s2.6g 2G | Medida | NIST | |
| 656.4519 nm | 9 | Be I | emission | 1s2.2p2 1D → 1s2.2s.6f 1F* | Medida | NIST | |
| 663.633 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | Medida | NIST | |
| 663.644 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | Medida | NIST | |
| 663.644 nm | N/D | Be II | emission | 1s2.4d 2D → 1s2.6p 2P* | Medida | NIST | |
| 671.15 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 671.21 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 671.23 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 671.25 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 671.25 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 671.26 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.9d 3D | Medida | NIST | |
| 672.598 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.6p 1P* | Medida | NIST | |
| 675.675 nm | 10 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | Medida | NIST | |
| 675.712 nm | 110 | Be II | emission | 1s2.4p 2P* → 1s2.6s 2S | Medida | NIST | |
| 678.656 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | Medida | NIST | |
| 678.656 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | Medida | NIST | |
| 678.656 nm | N/D | Be I | emission | 1s2.2s.3s 3S → 1s2.2s.4p 3P* | Medida | NIST | |
| 688.422 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 688.422 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 688.423 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 688.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 688.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 688.444 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8d 3D | Medida | NIST | |
| 698.273 nm | 13 | Be I | emission | 1s2.2s.2p 1P* → 1s2.2p2 1D | Medida | NIST | |
| 704.98 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | Medida | NIST | |
| 704.98 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | Medida | NIST | |
| 705 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.8s 3S | Medida | NIST | |
| 715.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 715.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 715.441 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 715.459 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 715.46 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 715.465 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7d 3D | Medida | NIST | |
| 720.9132 nm | 13 | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 1F* | Medida | NIST | |
| 720.928 nm | N/D | Be I | emission | 1s2.2p2 1D → 1s2.2s.5f 3F* | Medida | NIST | |
| 730.819 nm | N/D | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9d 1D | Medida | NIST | |
| 740.1196 nm | 210 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | Medida | NIST | |
| 740.1431 nm | 110 | Be II | emission | 1s2.4s 2S → 1s2.5p 2P* | Medida | NIST | |
| 743.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | Medida | NIST | |
| 743.44 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | Medida | NIST | |
| 743.46 nm | N/D | Be I | emission | 1s2.2s.3p 3P* → 1s2.2s.7s 3S | Medida | NIST | |
| 744.887 nm | N/D | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.9s 1S | Medida | NIST | |
| 749.842 nm | N/D | Be I | emission | 1s2.2s.3p 1P* → 1s2.2s.8d 1D | Medida | NIST |
Propriedades ampliadas
Raios covalentes (dados ampliados)
- Raio covalente (Pyykkö)
- 102 pm
- Raio covalente (Pyykkö, ligação dupla)
- 90 pm
- Raio covalente (Pyykkö, ligação tripla)
- 85 pm
- Raio covalente (Bragg)
- 115 pm
Raios de van der Waals
- Truhlar
- 153 pm
- Batsanov
- 190 pm
- Alvarez
- 198 pm
- UFF
- 274,5 pm
- MM3
- 223 pm
Raios atômicos e metálicos
- Raio atômico (Rahm)
- 219 pm
- Raio metálico (C12)
- 112 pm
Escalas de numeração
- Mendeleev
- 75
- Pettifor
- 77
- Glawe
- 77
Escalas de eletronegatividade
- Ghosh
- 0
- Miedema
- 5
- Gunnarsson–Lundqvist
- 4
- Robles–Bartolotti
- 4
Polarizabilidade e dispersão
- Polarizabilidade dipolar
- 37,74 a.u.
- Polarizabilidade dipolar (incerteza)
- 0,03 a.u.
- C₆
- 227 Ha·Bohr6
- C₆ (Gould–Bučko)
- 214 Ha·Bohr6
Parâmetros de Miedema
- Volume molar de Miedema
- 4,9 cm3/mol
- Densidade eletrônica de Miedema
- 5
Risco de abastecimento e economia
- Concentração da produção
- 85
- Risco relativo de abastecimento
- 8
- Estabilidade política (maior produtor)
- 57
Transições de fase e alótropos
| Ponto de fusão | 1560,15 K |
| Ponto de ebulição | 2741,15 K |
| Ponto crítico (temperatura) | 5205,15 K |
Categorias de estados de oxidação
Dados de referência avançados
Constantes de blindagem (2)
| n | Orbital | σ |
|---|---|---|
| 1 | s | 0,3152 |
| 2 | s | 2,088 |
Detalhes dos raios cristalinos (3)
| Carga | CN | Spin | rcrystal (pm) | Origem |
|---|---|---|---|---|
| 2 | III | 30 | ||
| 2 | IV | 41 | ||
| 2 | VI | 59 | calculated, |
Modos de decaimento dos isótopos (19)
| Isótopo | Modo | Intensidade |
|---|---|---|
| 5 | p | — |
| 6 | 2p | 100% |
| 7 | EC | 100% |
| 8 | A | 100% |
| 10 | B- | 100% |
| 11 | B- | 100% |
| 11 | B-A | 3,3% |
| 11 | B-p | 0% |
| 11 | B-n | — |
| 12 | B- | 100% |
Fatores de espalhamento de raios X (724)
| Energia (eV) | f₁ | f₂ |
|---|---|---|
| 10 | — | 1,70333 |
| 10,1617 | — | 1,71802 |
| 10,3261 | — | 1,73284 |
| 10,4931 | — | 1,74778 |
| 10,6628 | — | 1,75737 |
| 10,8353 | — | 1,76678 |
| 11,0105 | — | 1,77624 |
| 11,1886 | — | 1,78574 |
| 11,3696 | — | 1,7953 |
| 11,5535 | — | 1,80306 |
Dados adicionais
Estimated Crustal Abundance
The estimated element abundance in the earth's crust.
2.8 milligrams per kilogram
Referências (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Estimated Oceanic Abundance
The estimated element abundance in the earth's oceans.
5.6×10-6 milligrams per liter
Referências (1)
- [5] Beryllium https://education.jlab.org/itselemental/ele004.html
Sources
Sources of this element.
Beryllium is found in some 30 mineral species, the most important of which are bertrandite, beryl, chrysoberyl, and phenacite. Aquamarine and emerald are precious forms of beryl. Beryl and bertrandite are the most important commercial sources of the element and its compounds. Most of the metal is now prepared by reducing beryllium fluoride with magnesium metal. Beryllium metal did not become readily available to industry until 1957.
Referências (1)
- [6] Beryllium https://periodic.lanl.gov/4.shtml
Referências
(9)
Data deposited in or computed by PubChem
The half-life and atomic mass data was provided by the Atomic Mass Data Center at the International Atomic Energy Agency.
Element data are cited from the Atomic weights of the elements (an IUPAC Technical Report). The IUPAC periodic table of elements can be found at https://iupac.org/what-we-do/periodic-table-of-elements/. Additional information can be found within IUPAC publication doi:10.1515/pac-2015-0703 Copyright © 2020 International Union of Pure and Applied Chemistry.
The information are cited from Pure Appl. Chem. 2018; 90(12): 1833-2092, https://doi.org/10.1515/pac-2015-0703.
Thomas Jefferson National Accelerator Facility (Jefferson Lab) is one of 17 national laboratories funded by the U.S. Department of Energy. The lab's primary mission is to conduct basic research of the atom's nucleus using the lab's unique particle accelerator, known as the Continuous Electron Beam Accelerator Facility (CEBAF). For more information visit https://www.jlab.org/
The periodic table at the LANL (Los Alamos National Laboratory) contains basic element information together with the history, source, properties, use, handling and more. The provenance data may be found from the link under the source name.
The periodic table contains NIST's critically-evaluated data on atomic properties of the elements. The provenance data that include data for atomic spectroscopy, X-ray and gamma ray, radiation dosimetry, nuclear physics, and condensed matter physics may be found from the link under the source name. Ref: https://www.nist.gov/pml/atomic-spectra-database
This section provides all form of data related to element Beryllium.
The element property data was retrieved from publications.