Fluorine (F)
halogenGas
標準原子量
18.998403 u電子配置
[He] 2s2 2p5融点
-219.62 °C沸点
-188.12 °C密度
1.696 kg/m³酸化数
-1電気陰性度（Pauling）
3.98第1イオン化エネルギー
17.42282 eV発見年
1886原子半径
50 pm詳細
Fluorine is the lightest halogen and the most electronegative chemical element. In elemental form it occurs as diatomic fluorine, F₂, a highly reactive oxidizing gas. Natural fluorine is almost entirely the stable isotope ¹⁹F and is found in minerals rather than as the free element. Its chemistry underlies fluoride minerals, uranium enrichment chemistry, fluoropolymers, refrigerants, many agrochemicals, and a large share of modern medicinal chemistry.
Fluorine is the most electronegative and reactive of all elements. It is a pale yellow, corrosive gas, which reacts with most organic and inorganic substances. Finely divided metals, glass, ceramics, carbon, and even water burn in fluorine with a bright flame.
Until World War II, there was no commercial production of elemental fluorine. The nuclear bomb project and nuclear energy applications, however, made it necessary to produce large quantities.
The name derives from the Latin fluere for "flow" or "flux" because fluorite (CaF2) was used as a flux in metallurgy owing to its low melting point. It was discovered in hydrofluoric acid by the Swedish pharmacist and chemist Carl-Wilhelm Scheele in 1771, but it was not isolated until 1886 by the French pharmacist and chemist Henri Moissan.
Fluorine is the most reactive of all elements and no chemical substance is capable of freeing fluorine from any of its compounds. For this reason, fluorine does not occur free in nature and was extremely difficult for scientists to isolate. The first recorded use of a fluorine compound dates to around 1670 to a set of instructions for etching glass that called for Bohemian emerald (CaF2). Chemists attempted to identify the material that was capable of etching glass and George Gore was able to produce a small amount of fluorine through an electrolytic process in 1869. Unknown to Gore, fluorine gas explosively combines with hydrogen gas. That is exactly what happened in Gore's experiment when the fluorine gas that formed on one electrode combined with the hydrogen gas that formed on the other electrode. Ferdinand Frederic Henri Moissan, a French chemist, was the first to successfully isolate fluorine in 1886. He did this through the electrolysis of potassium fluoride (KF) and hydrofluoric acid (HF). He also completely isolated the fluorine gas from the hydrogen gas and he built his electrolysis device completely from platinum. His work was so impressive that he was awarded the Nobel Prize for chemistry in 1906. Today, fluorine is still produced through the electrolysis of potassium fluoride and hydrofluoric acid as well as through the electrolysis of molten potassium acid fluoride (KHF2).
From the Latin and French fluere: flow or flux. In 1529, Georigius Agricola described the use of fluorspar as a flux, and as early as 1670 Schwandhard found that glass was etched when exposed to fluorspar treated with acid. Scheele and many later investigators, including Davy, Gay-Lussac, Lavoisier, and Thenard, experimented with hydrofluoric acid, some experiments ending tragically.
The element was finally isolated in 1866 by Moissan after nearly 74 years of continuous effort.
Pure fluorine, F₂, is a pale yellow gas at ordinary temperature and pressure. It condenses to a yellow liquid and freezes to a pale solid at low temperature. The gas has a sharp, irritating odor, but odor is not a safe means of detection.
Elemental fluorine, F₂, is used mainly where its extreme oxidizing and fluorinating power is required, including preparation of uranium hexafluoride, UF₆, for isotope separation and manufacture of some specialty inorganic fluorides. Much larger practical importance lies in fluorine-containing compounds. Fluoropolymers such as polytetrafluoroethylene, (C₂F₄)ₙ, are used for chemically resistant coatings, seals, membranes, and electrical insulation. Fluoride compounds are used in glass etching, aluminum production, dental products, pharmaceuticals, and crop-protection chemicals.
Fluorine is added to city water supplies in the proportion of about one part per million to help prevent tooth decay. Sodium fluoride (NaF), stannous(II) fluoride (SnF2) and sodium monofluorophosphate (Na2PO3F) are all fluorine compounds added to toothpaste, also to help prevent tooth decay. Hydrofluoric acid (HF) is used to etch glass, including most of the glass used in light bulbs. Uranium hexafluoride (UF6) is used to separate isotopes of uranium. Crystals of calcium fluoride (CaF2), also known as fluorite and fluorspar, are used to make lenses to focus infrared light. Fluorine joins with carbon to form a class of compounds known as fluorocarbons. Some of these compounds, such as dichlorodifluoromethane (CF2Cl2), were widely used in air conditioning and refrigeration systems and in aerosol spray cans, but have been phased out due to the damage they were causing to the earth's ozone layer.
Fluorine and its compounds are used in producing uranium (from the hexafluoride) and more than 100 commercial fluorochemicals, including many high-temperature plastics. Hydrofluoric acid etches glass of light bulbs. Fluorochlorohydrocarbons are extensively used in air conditioning and refrigeration.
The presence of fluorine as a soluble fluoride in drinking water to the extent of 2 ppm may cause mottled enamel in teeth when used by children acquiring permanent teeth; in smaller amounts, however, fluoride helps prevent dental cavities.
Elemental fluorine has been studied as a rocket propellant as it has an exceptionally high specific impulse value.
Isotopes in Medicine
18F is a radioactive fluorine isotope that is used in an 18F-FDG compound (18F-labeled, fluoro-deoxy glucose) for imaging the organs, bones, tissues, and brain of the body with a technique called positron emission topography (PET). The 18F-FDG compound is injected and the isotopically labeled glucose is consumed by any cell requiring glucose as a source of energy [98] R. Krebs. The History And Use Of Our Earth’s Chemical Elements: A Reference Guide, 2nd ed. Greenwood Press, Westport, CT (2006)., [99] World Nuclear Association. Radioisotopes in Medicine, World Nuclear Association (2014), Feb. 23; http://www.world-nuclear.org/info/inf55.html..
– 18F emits positrons that collect in tissue and interact with regular negative electrons when injected into the body. The positrons and electrons annihilate each other, producing two gamma rays that are emitted in opposite directions. The radiation is detected on a PET camera, which generates a picture of the body part being examined (Fig. IUPAC.9.1).
–Because 18F has a short half-life of about 110 min, there is little chance of radiation damage to the patient.
Fluorine most commonly has oxidation state −1 in compounds, as in hydrogen fluoride, HF, sodium fluoride, NaF, and calcium fluoride, CaF₂. With highly electropositive elements it forms ionic fluorides; with nonmetals it forms strongly covalent fluorides such as sulfur hexafluoride, SF₆, and silicon tetrafluoride, SiF₄. Fluorine can also form interhalogen compounds, including chlorine trifluoride, ClF₃. Oxygen fluorides such as oxygen difluoride, OF₂, are unusual because fluorine is assigned the negative oxidation state while oxygen is positive.
One hypothesis says that fluorine can be substituted for hydrogen wherever it occurs in organic compounds, which could lead to an astronomical number of new fluorine compounds. Compounds of fluorine with rare gases have now been confirmed in fluorides of xenon, radon, and krypton.
See more information at the Fluorine compound page.
Elemental fluorine, F₂, is acutely toxic, corrosive, and a powerful oxidizer that can ignite or violently react with many materials. Hydrogen fluoride, HF, is especially hazardous because it penetrates tissue and binds calcium and magnesium ions. Soluble fluorides can be toxic at sufficient dose, while controlled low concentrations of fluoride ion, F⁻, have dental uses. Some fluorinated gases are chemically stable but may be asphyxiants or potent greenhouse gases.
Elemental fluorine and the fluoride ion are highly toxic. The free element has a characteristic pungent odor, detectable in concentrations as low as 20 ppb, which is below the safe working level. The recommended maximum allowable concentration for a daily 8-hour time-weighted exposure is 1 ppm.
Fluorine enters the environment chiefly as fluoride in minerals, volcanic emissions, sea spray, industrial releases, and weathering products. Fluoride ion, F⁻, binds to calcium, aluminum, and iron phases and can be immobilized in soils or sediments, though mobility depends strongly on pH and water chemistry. Elevated natural or industrial fluoride in groundwater can affect teeth, bones, livestock, and vegetation. Persistent organofluorine compounds vary widely in mobility and degradation behavior.
Fluorine supply is based primarily on mining fluorite, CaF₂, with smaller contributions from fluorapatite-bearing phosphate rock processed in fertilizer production. Hydrogen fluoride, HF, is the central industrial intermediate, made by treating fluorite with sulfuric acid, H₂SO₄. Direct production and transport of elemental fluorine are limited by its reactivity, so it is commonly generated or consumed close to the point of use. Demand is tied to aluminum smelting, chemical manufacturing, electronics materials, fluoropolymers, and regulated refrigerant transitions. Recycling is important for some fluorinated materials but is often chemically or economically difficult.
Found in the minerals fluorite (CaF2) and cryolite(Na3AlF6). Electrolysis of hydrofluoric acid (HF) or potassium acid fluoride (KHF2) is the only practical method of commercial production.
Fluorine is relatively rare in the cosmos compared with neighboring light elements. It is thought to be made in several settings, including helium-burning regions of evolved stars, neutrino-driven processes in core-collapse supernovae, and possibly novae, with their relative contributions still studied. In planetary materials it is concentrated into minerals, melts, and volatile-bearing phases rather than remaining as free F₂.
- Fluorine has only one stable natural isotope, ¹⁹F.
- Fluorite, CaF₂, gave the element its name through its use as a flux.
- Glass etching by hydrogen fluoride, HF, reflects the strength of silicon-fluorine bonding.
- Polytetrafluoroethylene, (C₂F₄)ₙ, was discovered accidentally during refrigerant research.
- Uranium hexafluoride, UF₆, is volatile enough for gas-phase isotope enrichment.
- Fluoride minerals can preserve fluorine in rocks over geologic time.
画像
性質
物理的性質
- 原子半径（経験値）
- 50 pm 全元素の原子半径（経験値）を比較 →
- 共有結合半径
- 57 pm 全元素の共有結合半径を比較 →
- ファンデルワールス半径
- 135 pm 全元素のファンデルワールス半径を比較 →
- 密度
- 1.696 kg/m³ 全元素の密度を比較 →
- モル体積
- 0.0171 L/mol
- 標準温度・圧力（STP）での相
- 気体 全元素の標準温度・圧力（STP）での相を比較 →
- 融点
- -219.62 °C 全元素の融点を比較 →
- 沸点
- -188.12 °C 全元素の沸点を比較 →
- 熱伝導率
- 0.028 W/(m·K) 全元素の熱伝導率を比較 →
- 比熱容量
- 0.824 J/(g·K) 全元素の比熱容量を比較 →
- モル熱容量
- 31.304 J/(mol·K) 全元素のモル熱容量を比較 →
- 結晶構造
- 単斜晶系 全元素の結晶構造を比較 →
化学的性質
- 電気陰性度（Pauling）
- 3.98 全元素の電気陰性度（Pauling）を比較 →
- 電気陰性度（Allen）
- 4.193
- 電子親和力
- 3.4011 eV
- 第1イオン化エネルギー
- 17.42282 eV 全元素の第1イオン化エネルギーを比較 →
- 第2イオン化エネルギー
- 34.97093 eV 全元素の第2イオン化エネルギーを比較 →
- 第3イオン化エネルギー
- 62.708196 eV 全元素の第3イオン化エネルギーを比較 →
- 第4イオン化エネルギー
- 87.1753 eV 全元素の第4イオン化エネルギーを比較 →
- 第5イオン化エネルギー
- 114.249393 eV 全元素の第5イオン化エネルギーを比較 →
- 酸化数
- -1 全元素の酸化数を比較 →
- 価電子
- 7 全元素の価電子を比較 →
- 電子配置
- [He] 2s2 2p5
熱力学的性質
- 三重点（温度）
- -219.67 °C
- 三重点（圧力）
- 9e+4 Pa
- 臨界点（温度）
- -128.74 °C
- 臨界点（圧力）
- 5.1724e+6 Pa
- 融解熱
- 0.0026429 eV 全元素の融解熱を比較 →
- 蒸発熱
- 0.06778256 eV 全元素の蒸発熱を比較 →
- 原子化熱
- 0.8228222 eV
- 原子化エンタルピー
- 0.82225216 eV
原子核
- 陽子数
- 9 全元素の陽子数を比較 →
- 中性子数
- 10 全元素の中性子数を比較 →
- 既知の同位体
- 19 全元素の既知の同位体を比較 →
- 安定同位体
- 1 全元素の安定同位体を比較 →
- 最も安定な同位体
- F-19
- 発見年
- 1886
存在度
- 存在度（地殻）
- 585 mg/kg 全元素の存在度（地殻）を比較 →
- 存在度（海洋）
- 1.3 mg/L 全元素の存在度（海洋）を比較 →
結晶構造
データなし
電子構造
- 各電子殻の電子数
- 2, 7 全元素の各電子殻の電子数を比較 →
識別子
- CAS登録番号
- 7782-41-4 全元素のCAS登録番号を比較 →
- 項記号
- 2P°3/2
- InChI
- InChI=1S/F
- InChI Key
- YCKRFDGAMUMZLT-UHFFFAOYSA-N
電子配置 測定値
F: 2s² 2p⁵[He] 2s² 2p⁵1s² 2s² 2p⁵原子モデル
同位体によって中性子数、質量、安定性は変わりますが、中性原子の電子配置は変わりません。
模式的な原子モデルです。実際の縮尺とは異なります。
原子の指紋
発光／吸収スペクトル
同位体分布
| 質量数 | 原子質量（u） | 天然存在比 | 半減期 |
|---|---|---|---|
| 19 安定 | 18.99840316273 ± 0.00000000092 | 100.0000% | 安定 |
相／状態
理由: 沸点（-188.12 °C）より213.1 °C高い
模式図、実際の縮尺とは異なります
相転移点
相転移エネルギー
融点で1 molを融解させるのに必要なエネルギー
沸点で1 molを蒸発させるのに必要なエネルギー
密度
標準条件下
現在の温度Tにおいて理想気体の状態方程式で推定
詳細
原子スペクトル
スペクトル線データの収録状況 ?
| イオン | 電荷 | スペクトル線の総数 | 遷移確率 | 準位の表記 |
|---|---|---|---|---|
| F I | 0 | 162 | 120 | 162 |
| F II | +1 | 150 | 67 | 67 |
| F III | +2 | 141 | 34 | 34 |
| F IV | +3 | 75 | 30 | 30 |
| F V | +4 | 513 | 472 | 472 |
| F VI | +5 | 269 | 269 | 269 |
| F VII | +6 | 470 | 439 | 470 |
| F VIII | +7 | 128 | 128 | 128 |
| F IX | +8 | 137 | 137 | 137 |
準位データの収録状況 ?
| イオン | 電荷 | 準位 |
|---|---|---|
| F I | 0 | 303 |
| F II | +1 | 291 |
| F III | +2 | 278 |
| F IV | +3 | 170 |
| F V | +4 | 138 |
| F VI | +5 | 100 |
| F VII | +6 | 77 |
| F VIII | +7 | 151 |
| F IX | +8 | 149 |
イオン半径
| 電荷 | 配位 | スピン | 半径 |
|---|---|---|---|
| -1 | 2 | データなし | 128.5 pm |
| -1 | 3 | データなし | 130 pm |
| -1 | 4 | データなし | 131 pm |
| -1 | 6 | データなし | 133 pm |
| +7 | 6 | データなし | 8 pm |
化合物
同位体 (1)
| 質量数 | 原子質量（u） | 天然存在比 | 半減期 | 崩壊形式 | |
|---|---|---|---|---|---|
| 19 安定 | 18.99840316273 ± 0.00000000092 | 100.0000% | 安定 | stable |
スペクトル線
| 波長（nm） | 強度 | 電離段階 | 種類 | 遷移 | 精度 | 出典 | |
|---|---|---|---|---|---|---|---|
| 383.22 nm | データなし | F V | emission | 2s.2p.(3P*).4d 2F* → 2p2.(1D).3d 2D | 測定値 | NIST | |
| 384.7086 nm | 270 | F II | emission | 2s2.2p3.(4S*).3s 5S* → 2s2.2p3.(4S*).3p 5P | 測定値 | NIST | |
| 384.9985 nm | 260 | F II | emission | 2s2.2p3.(4S*).3s 5S* → 2s2.2p3.(4S*).3p 5P | 測定値 | NIST | |
| 385.1668 nm | 250 | F II | emission | 2s2.2p3.(4S*).3s 5S* → 2s2.2p3.(4S*).3p 5P | 測定値 | NIST | |
| 385.69 nm | データなし | F VI | emission | 1s2.2s.3s 1S → 1s2.2s.3p 3P* | 測定値 | NIST | |
| 385.712 nm | データなし | F V | emission | 2p2.(3P).3p 4S* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 387.086 nm | データなし | F V | emission | 2p2.(3P).3p 4S* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 388.508 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 388.6 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 388.6 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 388.6 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8g 2G | 測定値 | NIST | |
| 389.2 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8d 2D | 測定値 | NIST | |
| 389.2 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8d 2D | 測定値 | NIST | |
| 389.2 nm | データなし | F VII | emission | 1s2.7f 2F* → 1s2.8d 2D | 測定値 | NIST | |
| 390.229 nm | データなし | F V | emission | 2p2.(3P).3p 4S* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 390.45 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 394.51 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2F | 測定値 | NIST | |
| 394.51 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2F | 測定値 | NIST | |
| 394.51 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2F | 測定値 | NIST | |
| 394.518 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 394.736 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 396.08 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 396.113 nm | データなし | F IV | emission | 2s2.2p2 3P → 2s2.2p2 1D | 測定値 | NIST | |
| 399.6 nm | データなし | F VII | emission | 1s2.7d 2D → 1s2.8p 2P* | 測定値 | NIST | |
| 399.6 nm | データなし | F VII | emission | 1s2.7d 2D → 1s2.8p 2P* | 測定値 | NIST | |
| 399.6 nm | データなし | F VII | emission | 1s2.7d 2D → 1s2.8p 2P* | 測定値 | NIST | |
| 399.692 nm | データなし | F IV | emission | 2s2.2p2 3P → 2s2.2p2 1D | 測定値 | NIST | |
| 399.692 nm | データなし | F IV | emission | 2s2.2p2 3P → 2s2.2p2 1D | 測定値 | NIST | |
| 400.26 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 400.942 nm | データなし | F V | emission | 2p2.(3P).3s 4P → 2s.2p.(3P*).4s 4P* | 測定値 | NIST | |
| 402.4726 nm | 240 | F II | emission | 2s2.2p3.(4S*).3s 3S* → 2s2.2p3.(4S*).3p 3P | 測定値 | NIST | |
| 402.501 nm | 220 | F II | emission | 2s2.2p3.(4S*).3s 3S* → 2s2.2p3.(4S*).3p 3P | 測定値 | NIST | |
| 402.5491 nm | 230 | F II | emission | 2s2.2p3.(4S*).3s 3S* → 2s2.2p3.(4S*).3p 3P | 測定値 | NIST | |
| 405.99 nm | データなし | F IV | emission | 2s2.2p2 3P → 2s2.2p2 1D | 測定値 | NIST | |
| 405.99 nm | データなし | F IV | emission | 2s2.2p2 3P → 2s2.2p2 1D | 測定値 | NIST | |
| 410.3075 nm | 190 | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.3213 nm | 170 | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.3506 nm | 200 | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.3713 nm | 180 | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.387 nm | 170 | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.4008 nm | データなし | F II | emission | 2s2.2p3.(4S*).3p 3P → 2s2.2p3.(4S*).3d 3D* | 測定値 | NIST | |
| 410.916 nm | 170 | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.03 nm | データなし | F VI | emission | 1s2.2s.3p 1P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 411.272 nm | データなし | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.2969 nm | データなし | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.44 nm | データなし | F VI | emission | 1s2.2s.3p 1P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 411.6535 nm | 160 | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.699 nm | データなし | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.8752 nm | データなし | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 411.9207 nm | 150 | F II | emission | 2s2.2p3.(2D*).3s 3D* → 2s2.2p3.(2D*).3p 3D | 測定値 | NIST | |
| 415.775 nm | データなし | F II | emission | 2s2.2p4 1D → 2s2.2p4 1S | 測定値 | NIST | |
| 423.3 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 424.76 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 426.19 nm | データなし | F V | emission | 2s.2p.(3P*).3p 2D → 2s.2p.(3P*).3d 2D* | 測定値 | NIST | |
| 426.28 nm | データなし | F VI | emission | 1s2.2s.3s 1S → 1s2.2s.3p 1P* | 測定値 | NIST | |
| 427.32 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 427.94 nm | データなし | F V | emission | 2s.2p.(3P*).3p 2D → 2s.2p.(3P*).3d 2D* | 測定値 | NIST | |
| 429.9165 nm | 200 | F II | emission | 2s2.2p3.(2D*).3s 1D* → 2s2.2p3.(2D*).3p 1F | 測定値 | NIST | |
| 432.27 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 433.94 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 435.28 nm | データなし | F V | emission | 2s.2p.(3P*).3p 2D → 2s.2p.(3P*).3d 2D* | 測定値 | NIST | |
| 437.11 nm | データなし | F V | emission | 2s.2p.(3P*).3p 2D → 2s.2p.(3P*).3d 2D* | 測定値 | NIST | |
| 439.05 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3P* | 測定値 | NIST | |
| 444.6527 nm | 160 | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 444.6689 nm | データなし | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 444.6721 nm | 170 | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 444.7117 nm | データなし | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 444.7148 nm | データなし | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 444.7188 nm | 180 | F II | emission | 2s2.2p3.(4S*).3d 3D* → 2s2.2p3.(4S*).4f 3F | 測定値 | NIST | |
| 455.99 nm | データなし | F VI | emission | 1s2.2p.3p 1D → 1s2.2p.3d 1F* | 測定値 | NIST | |
| 456.45 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 457.45 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 457.96 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 459.81 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 460.57 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 461.08 nm | データなし | F VI | emission | 1s2.2s.3p 3P* → 1s2.2s.3d 3D | 測定値 | NIST | |
| 463.41 nm | データなし | F VI | emission | 1s2.2p.4p 1P → 1s2.2p.4d 1P* | 測定値 | NIST | |
| 478.945 nm | データなし | F II | emission | 2s2.2p4 3P → 2s2.2p4 1D | 測定値 | NIST | |
| 478.945 nm | データなし | F II | emission | 2s2.2p4 3P → 2s2.2p4 1D | 測定値 | NIST | |
| 486.899 nm | データなし | F II | emission | 2s2.2p4 3P → 2s2.2p4 1D | 測定値 | NIST | |
| 486.899 nm | データなし | F II | emission | 2s2.2p4 3P → 2s2.2p4 1D | 測定値 | NIST | |
| 490.456 nm | データなし | F II | emission | 2s2.2p4 3P → 2s2.2p4 1D | 測定値 | NIST | |
| 507.4 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 507.86 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 509.78 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 510.25 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 511.78 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 515.72 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 517.29 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 517.4 nm | データなし | F VIII | emission | 1s.3s 3S → 1s.3p 3P* | 測定値 | NIST | |
| 522.95 nm | データなし | F V | emission | 2s.2p.(3P*).4d 4D* → 2p2.(3P).3d 4P | 測定値 | NIST | |
| 525.1 nm | データなし | F VIII | emission | 1s.3s 3S → 1s.3p 3P* | 測定値 | NIST | |
| 528.03 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2D | 測定値 | NIST | |
| 528.03 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2D | 測定値 | NIST | |
| 528.03 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2D | 測定値 | NIST | |
| 528.03 nm | データなし | F V | emission | 2p2.(1D).3p 2D* → 2p2.(1D).3d 2D | 測定値 | NIST | |
| 533.07 nm | データなし | F VI | emission | 1s2.2p.3p 1S → 1s2.2p.3d 1P* | 測定値 | NIST | |
| 543.21 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 544 nm | データなし | F VII | emission | 1s2.8p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 544 nm | データなし | F VII | emission | 1s2.8p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 544 nm | データなし | F VII | emission | 1s2.8p 2P* → 1s2.9d 2D | 測定値 | NIST | |
| 545.91 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 549.84 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 549.99 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 556.76 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 560.85 nm | データなし | F VI | emission | 1s2.2p.3p 3P → 1s2.2p.3d 3D* | 測定値 | NIST | |
| 568.67 nm | データなし | F V | emission | 2s.2p.(3P*).3s 2P* → 2s.2p.(3P*).3p 2P | 測定値 | NIST | |
| 572.12 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 572.12 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 572.15 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 573.29 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 573.29 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 573.32 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 573.32 nm | データなし | F III | emission | 2s2.2p3 2D* → 2s2.2p3 2P* | 測定値 | NIST | |
| 576.14 nm | データなし | F V | emission | 2s.2p.(3P*).3s 2P* → 2s.2p.(3P*).3p 2P | 測定値 | NIST | |
| 585.63 nm | データなし | F V | emission | 2s.2p.(3P*).3s 2P* → 2s.2p.(3P*).3p 2P | 測定値 | NIST | |
| 593.55 nm | データなし | F V | emission | 2s.2p.(3P*).3s 2P* → 2s.2p.(3P*).3p 2P | 測定値 | NIST | |
| 604 nm | データなし | F VII | emission | 1s2.8d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 604 nm | データなし | F VII | emission | 1s2.8d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 604 nm | データなし | F VII | emission | 1s2.8d 2D → 1s2.9p 2P* | 測定値 | NIST | |
| 683 nm | データなし | F VII | emission | 1s2.9p 2P* → 1s2.10d 2D | 測定値 | NIST | |
| 683 nm | データなし | F VII | emission | 1s2.9p 2P* → 1s2.10d 2D | 測定値 | NIST | |
| 683 nm | データなし | F VII | emission | 1s2.9p 2P* → 1s2.10d 2D | 測定値 | NIST | |
| 713.8 nm | データなし | F V | emission | 2s.2p.(3P*).4p 2D → 2s.2p.(3P*).4d 2F* | 測定値 | NIST | |
| 719.4 nm | データなし | F V | emission | 2s.2p.(3P*).4p 2D → 2s.2p.(3P*).4d 2F* | 測定値 | NIST | |
| 723.4 nm | データなし | F VI | emission | 1s2.2p.4s 1P* → 1s2.2p.4p 1D | 測定値 | NIST | |
| 728.5 nm | データなし | F VIII | emission | 1s.3s 1S → 1s.3p 1P* | 測定値 | NIST | |
| 735.8 nm | データなし | F V | emission | 2s.2p.(3P*).4p 2D → 2s.2p.(3P*).4d 2F* | 測定値 | NIST |
詳細な性質
共有結合半径（詳細）
- 共有結合半径（Pyykkö）
- 64 pm
- 共有結合半径（Pyykkö、二重結合）
- 59 pm
- 共有結合半径（Pyykkö、三重結合）
- 53 pm
- 共有結合半径（Bragg）
- 67 pm
ファンデルワールス半径
- Bondi
- 147 pm
- Batsanov
- 150 pm
- Alvarez
- 146 pm
- UFF
- 336.4 pm
- MM3
- 171 pm
- Dreiding
- 347.2 pm
- Rowland–Taylor
- 146 pm
原子半径と金属半径
- 原子半径（Rahm）
- 163 pm
番号付けの尺度
- Mendeleev
- 106
- Pettifor
- 102
- Glawe
- 102
電気陰性度の尺度
- Ghosh
- 0
- Gunnarsson–Lundqvist
- 11
- Robles–Bartolotti
- 10
分極率と分散
- 双極子分極率
- 3.74 a.u.
- 双極子分極率（不確かさ）
- 0.08 a.u.
- C₆
- 9.52 Ha·Bohr6
- C₆ (Gould–Bučko)
- 10.2 Ha·Bohr6
化学親和力
- プロトン親和力
- 340.1 kJ/mol
- 気相塩基性
- 315.1 kJ/mol
供給リスクと経済性
- 生産集中度
- 56
- 相対供給リスク
- 7
- 埋蔵量の分布
- 17
- 政治的安定性（最大生産国）
- 24
- 政治的安定性（最大埋蔵国）
- 44
相転移と同素体
| 融点 | 53.48 K |
| 沸点 | 85.04 K |
| 臨界点（温度） | 144.41 K |
| 臨界点（圧力） | 5.17 MPa |
| 三重点（温度） | 53.48 K |
| 三重点（圧力） | 90 kPa |
酸化数の分類
専門参考データ
遮蔽定数 (3)
| n | 軌道 | σ |
|---|---|---|
| 1 | s | 0.3499 |
| 2 | p | 3.9 |
| 2 | s | 3.8724 |
結晶半径の詳細 (5)
| 電荷 | CN | スピン | rcrystal (pm) | 由来 |
|---|---|---|---|---|
| -1 | II | 114.5 | ||
| -1 | III | 116 | ||
| -1 | IV | 117 | ||
| -1 | VI | 119 | ||
| 7 | VI | 22 | Ahrens (1952) ionic radius, |
同位体の崩壊形式 (31)
| 同位体 | モード | 強度 |
|---|---|---|
| 13 | p | — |
| 14 | p | — |
| 15 | p | 100% |
| 16 | p | 100% |
| 17 | B+ | 100% |
| 18 | B+ | 100% |
| 20 | B- | 100% |
| 21 | B- | 100% |
| 22 | B- | 100% |
| 22 | B-n | 11% |
X線散乱因子 (502)
| エネルギー (eV) | f₁ | f₂ |
|---|---|---|
| 10 | — | 0.05165 |
| 10.1617 | — | 0.05648 |
| 10.3261 | — | 0.06176 |
| 10.4931 | — | 0.06754 |
| 10.6628 | — | 0.07386 |
| 10.8353 | — | 0.08077 |
| 11.0106 | — | 0.08833 |
| 11.1886 | — | 0.09659 |
| 11.3696 | — | 0.10831 |
| 11.5535 | — | 0.12462 |
追加データ
Estimated Crustal Abundance
The estimated element abundance in the earth's crust.
5.85×102 milligrams per kilogram
参考文献 (1)
- [5] Fluorine https://education.jlab.org/itselemental/ele009.html
Estimated Oceanic Abundance
The estimated element abundance in the earth's oceans.
1.3 milligrams per liter
参考文献 (1)
- [5] Fluorine https://education.jlab.org/itselemental/ele009.html
参考文献
(9)
Data deposited in or computed by PubChem
The half-life and atomic mass data was provided by the Atomic Mass Data Center at the International Atomic Energy Agency.
Element data are cited from the Atomic weights of the elements (an IUPAC Technical Report). The IUPAC periodic table of elements can be found at https://iupac.org/what-we-do/periodic-table-of-elements/. Additional information can be found within IUPAC publication doi:10.1515/pac-2015-0703 Copyright © 2020 International Union of Pure and Applied Chemistry.
The information are cited from Pure Appl. Chem. 2018; 90(12): 1833-2092, https://doi.org/10.1515/pac-2015-0703.
Thomas Jefferson National Accelerator Facility (Jefferson Lab) is one of 17 national laboratories funded by the U.S. Department of Energy. The lab's primary mission is to conduct basic research of the atom's nucleus using the lab's unique particle accelerator, known as the Continuous Electron Beam Accelerator Facility (CEBAF). For more information visit https://www.jlab.org/
The periodic table at the LANL (Los Alamos National Laboratory) contains basic element information together with the history, source, properties, use, handling and more. The provenance data may be found from the link under the source name.
The periodic table contains NIST's critically-evaluated data on atomic properties of the elements. The provenance data that include data for atomic spectroscopy, X-ray and gamma ray, radiation dosimetry, nuclear physics, and condensed matter physics may be found from the link under the source name. Ref: https://www.nist.gov/pml/atomic-spectra-database
This section provides all form of data related to element Fluorine.
The element property data was retrieved from publications.